X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 297.0
Details 25%PEG3350, 0.2M Na Chloride, 0.1MHEPES, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 74.79 α = 90
b = 74.79 β = 90
c = 163.79 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2011-07-06
Diffraction Radiation
Monochromator Protocol
Si 111 channel SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9772 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 99.7 0.063 0.063 -- 7.8 21382 21382 0.0 -3.0 57.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.34 99.1 0.595 0.595 3.7 7.8 1051

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.3 50.0 0.0 0.0 20207 20207 1091 99.64 0.17836 0.17836 0.17633 0.21718 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.303 2.362 -- 68 1290 0.235 0.345 -- 99.27
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 54.211
Anisotropic B[1][1] 2.94
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.94
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.88
RMS Deviations
Key Refinement Restraint Deviation
r_gen_planes_other 0.001
r_gen_planes_refined 0.008
r_chiral_restr 0.099
r_dihedral_angle_4_deg 16.918
r_dihedral_angle_3_deg 15.71
r_dihedral_angle_2_deg 36.863
r_dihedral_angle_1_deg 6.387
r_angle_other_deg 0.987
r_angle_refined_deg 1.786
r_bond_other_d 0.006
r_bond_refined_d 0.018
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2723
Nucleic Acid Atoms 0
Heterogen Atoms 28
Solvent Atoms 92

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
HKL-3000:SHELXD, SHELXE, DM, MLPHARE, RESOLVE, CCP4, ARP/WARP Structure Solution
REFMAC 5.6.0117, COOT Structure Refinement
Software
Software Name Purpose
COOT refinement
REFMAC version: 5.6.0117 refinement
ARP/WARP model building
CCP4 model building
RESOLVE model building
MLPHARE model building
DM model building
SHELXE model building
HKL-3000:SHELXD model building
HKL-3000 data collection