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X-RAY DIFFRACTION
Materials and Methods page
3U4I
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 298.0
    Details 100mM MES, 12% PEG 4000, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.22 α = 105.2
    b = 54 β = 91.08
    c = 66.55 γ = 94.68
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2007-07-14
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE A1
    Wavelength List 0.9778
    Site CHESS
    Beamline A1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.1
    Resolution(Low) 30
    Number Reflections(All) 30776
    Number Reflections(Observed) 30776
    Percent Possible(Observed) 96.4
    B(Isotropic) From Wilson Plot 34.38
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.18
    Percent Possible(All) 85.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.118
    Resolution(Low) 23.434
    Cut-off Sigma(F) 1.97
    Number of Reflections(all) 30761
    Number of Reflections(Observed) 30761
    Number of Reflections(R-Free) 1550
    Percent Reflections(Observed) 95.75
    R-Factor(All) 0.1815
    R-Factor(Observed) 0.1815
    R-Work 0.1795
    R-Free 0.2172
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 52.1413
    Anisotropic B[1][1] -6.7822
    Anisotropic B[1][2] 2.6622
    Anisotropic B[1][3] 1.6332
    Anisotropic B[2][2] 0.1647
    Anisotropic B[2][3] 5.026
    Anisotropic B[3][3] 6.6175
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1176
    Shell Resolution(Low) 2.1859
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 2155
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.2989
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1859
    Shell Resolution(Low) 2.2639
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2283
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2639
    Shell Resolution(Low) 2.3545
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3545
    Shell Resolution(Low) 2.4615
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2691
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2377
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4615
    Shell Resolution(Low) 2.5912
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2373
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5912
    Shell Resolution(Low) 2.7533
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1887
    R-Factor(R-Free) 0.2325
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7533
    Shell Resolution(Low) 2.9655
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9655
    Shell Resolution(Low) 3.2632
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1879
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2632
    Shell Resolution(Low) 3.7338
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7338
    Shell Resolution(Low) 4.6979
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1763
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6979
    Shell Resolution(Low) 23.4359
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2744
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.858
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_angle_d 1.051
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3978
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 148
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)
    model building MOLREP
    data collection ADSC version: Quantum