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X-RAY DIFFRACTION
Materials and Methods page
3U4E
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 13% (w/v) PEG 3350, 11% (v/v) 2-methyl-2,4-pentanediol, 0.2 M lithium sulfate, 0.1 M imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.03 α = 90
    b = 103.54 β = 90
    c = 186.37 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-08-14
     
    Diffraction Radiation
    Monochromator double crystal - liquid nitrogen cooled
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.19
    Resolution(Low) 50
    Number Reflections(All) 73822
    Number Reflections(Observed) 67917
    Percent Possible(Observed) 92.0
    Redundancy 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.19
    Resolution(Low) 2.24
    Percent Possible(All) 68.7
    R Merge I(Observed) 0.339
    Mean I Over Sigma(Observed) 2.4
    Redundancy 2.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.185
    Resolution(Low) 27.693
    Cut-off Sigma(F) 1.91
    Number of Reflections(all) 73950
    Number of Reflections(Observed) 67657
    Number of Reflections(R-Free) 3442
    Percent Reflections(Observed) 91.49
    R-Factor(Observed) 0.1845
    R-Work 0.1818
    R-Free 0.2336
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.8889
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -6.6663
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.7774
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1851
    Shell Resolution(Low) 2.215
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1655
    R-Factor(R-Work) 0.2305
    R-Factor(R-Free) 0.3096
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.215
    Shell Resolution(Low) 2.2466
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 1960
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.3199
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2466
    Shell Resolution(Low) 2.2801
    Number of Reflections(R-Free) 90
    Number of Reflections(R-Work) 2048
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2801
    Shell Resolution(Low) 2.3157
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2102
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3157
    Shell Resolution(Low) 2.3537
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2201
    R-Factor(R-Work) 0.2251
    R-Factor(R-Free) 0.3094
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3537
    Shell Resolution(Low) 2.3943
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2219
    R-Factor(R-Work) 0.22
    R-Factor(R-Free) 0.3373
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3943
    Shell Resolution(Low) 2.4378
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2324
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.2983
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4378
    Shell Resolution(Low) 2.4846
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2427
    R-Factor(R-Work) 0.2344
    R-Factor(R-Free) 0.3272
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4846
    Shell Resolution(Low) 2.5353
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2503
    R-Factor(R-Work) 0.2419
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5353
    Shell Resolution(Low) 2.5904
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2545
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5904
    Shell Resolution(Low) 2.6506
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6506
    Shell Resolution(Low) 2.7168
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.2341
    R-Factor(R-Free) 0.3034
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7168
    Shell Resolution(Low) 2.7902
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.3271
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7902
    Shell Resolution(Low) 2.8723
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2814
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8723
    Shell Resolution(Low) 2.9649
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.2926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9649
    Shell Resolution(Low) 3.0707
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0707
    Shell Resolution(Low) 3.1935
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1935
    Shell Resolution(Low) 3.3386
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2838
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3386
    Shell Resolution(Low) 3.5143
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2806
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5143
    Shell Resolution(Low) 3.734
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2813
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.1998
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.734
    Shell Resolution(Low) 4.0215
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2823
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0215
    Shell Resolution(Low) 4.4247
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.1349
    R-Factor(R-Free) 0.1752
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4247
    Shell Resolution(Low) 5.0616
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.1235
    R-Factor(R-Free) 0.1635
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0616
    Shell Resolution(Low) 6.3643
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1923
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3643
    Shell Resolution(Low) 27.6949
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2997
    R-Factor(R-Work) 0.1883
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.076
    f_dihedral_angle_d 14.162
    f_angle_d 1.094
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8478
    Nucleic Acid Atoms 0
    Heterogen Atoms 348
    Solvent Atoms 486
     
     
  •   Software and Computing Hide
    Computing
    Data Collection sergui
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Phaser
    data collection sergui