X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 15% PEG 3350, 9% 2-Methyl-2,4-pentanediol, 0.1M Li2SO4, 0.1M Imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86.2 α = 90
b = 86.2 β = 90
c = 185.68 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2011-08-15
Diffraction Radiation
Monochromator Protocol
SI 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 50 -- -- -- -- -- 29046 16038 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.9 3.0 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.893 30.475 -- 1.33 16038 15976 811 97.86 -- 0.2237 0.2214 0.268 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.893 3.0741 -- 135 2331 0.29 0.3497 -- 93.0
X Ray Diffraction 3.0741 3.3112 -- 130 2522 0.2624 0.2722 -- 99.0
X Ray Diffraction 3.3112 3.6439 -- 139 2512 0.2312 0.2826 -- 99.0
X Ray Diffraction 3.6439 4.1701 -- 140 2529 0.2119 0.2504 -- 99.0
X Ray Diffraction 4.1701 5.2495 -- 117 2577 0.1775 0.222 -- 98.0
X Ray Diffraction 5.2495 30.4766 -- 150 2694 0.2325 0.2837 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 4.5086
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 4.5086
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -9.0172
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.048
f_dihedral_angle_d 11.396
f_angle_d 0.722
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3381
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 38

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASES Structure Solution
PHENIX (phenix.refine: 1.7.2_869) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.2_869) refinement
PHASES model building
HKL-2000 data collection