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X-RAY DIFFRACTION
Materials and Methods page
3U47
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 1.4 M Sodium Citrate, 50 mM Tris pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.27 α = 90
    b = 41.58 β = 104.53
    c = 72.29 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV++
    Details mirrors
    Collection Date 2011-06-03
     
    Diffraction Radiation
    Monochromator rigaku varimax HR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.6
    Resolution(Low) 50
    Number Reflections(All) 29313
    Number Reflections(Observed) 28593
    Percent Possible(Observed) 90.7
    B(Isotropic) From Wilson Plot 24.3
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.66
    Percent Possible(All) 96.9
    R Merge I(Observed) 0.305
    Redundancy 3.1
    Number Unique Reflections(All) 3090
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 22.886
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 29306
    Number of Reflections(Observed) 28593
    Number of Reflections(R-Free) 1983
    Percent Reflections(Observed) 88.41
    R-Factor(All) 0.189
    R-Factor(Observed) 0.1816
    R-Work 0.1794
    R-Free 0.2113
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.0794
    Anisotropic B[1][1] -0.7197
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.3403
    Anisotropic B[2][2] 0.5698
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.1499
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5999
    Shell Resolution(Low) 1.6399
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1901
    R-Factor(R-Work) 0.3595
    R-Factor(R-Free) 0.3889
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6399
    Shell Resolution(Low) 1.6842
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1979
    R-Factor(R-Work) 0.2902
    R-Factor(R-Free) 0.3039
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6842
    Shell Resolution(Low) 1.7338
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1954
    R-Factor(R-Work) 0.2247
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7338
    Shell Resolution(Low) 1.7897
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1948
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7897
    Shell Resolution(Low) 1.8536
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1955
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8536
    Shell Resolution(Low) 1.9278
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 1726
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9278
    Shell Resolution(Low) 2.0155
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1904
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0155
    Shell Resolution(Low) 2.1217
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2010
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1217
    Shell Resolution(Low) 2.2545
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1648
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2545
    Shell Resolution(Low) 2.4284
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2033
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2084
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4284
    Shell Resolution(Low) 2.6725
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2149
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.221
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6725
    Shell Resolution(Low) 3.0584
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2156
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0584
    Shell Resolution(Low) 3.8503
    Number of Reflections(R-Free) 95
    Number of Reflections(R-Work) 1265
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8503
    Shell Resolution(Low) 22.8879
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1982
    R-Factor(R-Work) 0.1477
    R-Factor(R-Free) 0.1638
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 12.836
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_angle_d 1.089
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2050
    Nucleic Acid Atoms 0
    Heterogen Atoms 7
    Solvent Atoms 271
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction HKL