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X-RAY DIFFRACTION
Materials and Methods page
3U46
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.5
    Temperature 293.0
    Details 16% PEG 400, 8% PEG 8000, 0.1M Acetate pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.61 α = 90
    b = 105.54 β = 90
    c = 163.98 γ = 90
     
    Space Group
    Space Group Name:    P 21 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 345 mm plate
    Collection Date 2011-07-22
     
    Diffraction Radiation
    Monochromator SI 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.9
    Resolution(Low) 50
    Number Reflections(Observed) 22893
     
    High Resolution Shell Details
    Resolution(High) 2.9
    Resolution(Low) 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.906
    Resolution(Low) 32.373
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 22836
    Number of Reflections(R-Free) 1176
    Percent Reflections(Observed) 82.38
    R-Factor(Observed) 0.2162
    R-Work 0.2147
    R-Free 0.2448
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 37.0769
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -20.4986
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.5783
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9064
    Shell Resolution(Low) 3.0386
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1647
    R-Factor(R-Work) 0.3627
    R-Factor(R-Free) 0.4298
    Percent Reflections(Observed) 51.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0386
    Shell Resolution(Low) 3.1986
    Number of Reflections(R-Free) 90
    Number of Reflections(R-Work) 2001
    R-Factor(R-Work) 0.3046
    R-Factor(R-Free) 0.3952
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1986
    Shell Resolution(Low) 3.3988
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2305
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3988
    Shell Resolution(Low) 3.6609
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2504
    R-Factor(R-Free) 0.2705
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6609
    Shell Resolution(Low) 4.0287
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3032
    R-Factor(R-Work) 0.2322
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0287
    Shell Resolution(Low) 4.6103
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3305
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2347
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6103
    Shell Resolution(Low) 5.803
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3294
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.1879
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.803
    Shell Resolution(Low) 32.3752
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3455
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2168
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.038
    f_dihedral_angle_d 9.874
    f_angle_d 0.582
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6762
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building PHASES
    data collection HKL-2000