X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 25% (w/v) PEG 3350, 15% (v/v) 2-methyl-2,4-pentanediol, 0.2 M lithium sulfate, 0.1 M imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.59 α = 107.23
b = 81.04 β = 90.13
c = 91.69 γ = 107.96
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-06-24
Diffraction Radiation
Monochromator Protocol
Si220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 50 89.2 -- -- -- -- 28094 25060 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.3 3.42 73.1 0.346 -- 1.87 1.5 2071

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.281 38.485 -- 1.97 28486 24997 1268 87.75 -- 0.2162 0.2145 0.2486 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2814 3.4127 -- 108 1873 0.3007 0.3495 -- 62.0
X Ray Diffraction 3.4127 3.568 -- 135 2349 0.28 0.337 -- 79.0
X Ray Diffraction 3.568 3.7559 -- 126 2504 0.2399 0.286 -- 83.0
X Ray Diffraction 3.7559 3.991 -- 119 2671 0.2221 0.2845 -- 88.0
X Ray Diffraction 3.991 4.2988 -- 169 2727 0.1836 0.2499 -- 92.0
X Ray Diffraction 4.2988 4.7307 -- 146 2854 0.1655 0.2197 -- 95.0
X Ray Diffraction 4.7307 5.4136 -- 158 2892 0.1753 0.2023 -- 96.0
X Ray Diffraction 5.4136 6.8144 -- 135 2969 0.2147 0.2425 -- 98.0
X Ray Diffraction 6.8144 38.4876 -- 172 2890 0.2407 0.2399 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -13.6383
Anisotropic B[1][2] 22.2372
Anisotropic B[1][3] -14.2427
Anisotropic B[2][2] 29.288
Anisotropic B[2][3] 11.1829
Anisotropic B[3][3] -15.6497
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.061
f_dihedral_angle_d 11.106
f_angle_d 0.9
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12824
Nucleic Acid Atoms 0
Heterogen Atoms 30
Solvent Atoms 0

Software

Computing
Computing Package Purpose
SERGUI Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
PHASER model building
SERGUI data collection