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X-RAY DIFFRACTION
Materials and Methods page
3U36
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 25% (w/v) PEG 3350, 15% (v/v) 2-methyl-2,4-pentanediol, 0.2 M lithium sulfate, 0.1 M imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.59 α = 107.23
    b = 81.04 β = 90.13
    c = 91.69 γ = 107.96
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-06-24
     
    Diffraction Radiation
    Monochromator Si220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 3.3
    Resolution(Low) 50
    Number Reflections(All) 28094
    Number Reflections(Observed) 25060
    Percent Possible(Observed) 89.2
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.42
    Percent Possible(All) 73.1
    R Merge I(Observed) 0.346
    Mean I Over Sigma(Observed) 1.87
    Redundancy 1.5
    Number Unique Reflections(All) 2071
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.281
    Resolution(Low) 38.485
    Cut-off Sigma(F) 1.97
    Number of Reflections(all) 28486
    Number of Reflections(Observed) 24997
    Number of Reflections(R-Free) 1268
    Percent Reflections(Observed) 87.75
    R-Factor(Observed) 0.2162
    R-Work 0.2145
    R-Free 0.2486
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -13.6383
    Anisotropic B[1][2] 22.2372
    Anisotropic B[1][3] -14.2427
    Anisotropic B[2][2] 29.288
    Anisotropic B[2][3] 11.1829
    Anisotropic B[3][3] -15.6497
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2814
    Shell Resolution(Low) 3.4127
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1873
    R-Factor(R-Work) 0.3007
    R-Factor(R-Free) 0.3495
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4127
    Shell Resolution(Low) 3.568
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2349
    R-Factor(R-Work) 0.28
    R-Factor(R-Free) 0.337
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.568
    Shell Resolution(Low) 3.7559
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2504
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.286
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7559
    Shell Resolution(Low) 3.991
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2845
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.991
    Shell Resolution(Low) 4.2988
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2499
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2988
    Shell Resolution(Low) 4.7307
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2854
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7307
    Shell Resolution(Low) 5.4136
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.2023
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4136
    Shell Resolution(Low) 6.8144
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2969
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2425
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.8144
    Shell Resolution(Low) 38.4876
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.2407
    R-Factor(R-Free) 0.2399
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 11.106
    f_angle_d 0.9
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12824
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHASER
    data collection SERGUI