X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 293.0
Details 8% (w/v) PEG 3350, 5% (v/v) 2-methyl-2,4-pentanediol, 90 mM lithium sulfate, 45 mM imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 89.46 α = 90
b = 86.57 β = 92.08
c = 94.88 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-07-11
Diffraction Radiation
Monochromator Protocol
Si220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 91.2 -- -- -- -- 134186 122378 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.83 64.8 0.438 -- 2.0 2.9 4342

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.797 41.581 -- 0.0 134464 122322 6166 90.97 -- 0.1792 0.1779 0.205 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7974 1.8178 -- 120 2510 0.2777 0.3172 -- 59.0
X Ray Diffraction 1.8178 1.8392 -- 151 2889 0.2509 0.2685 -- 68.0
X Ray Diffraction 1.8392 1.8617 -- 145 3008 0.2297 0.2694 -- 70.0
X Ray Diffraction 1.8617 1.8852 -- 162 3089 0.2144 0.2426 -- 73.0
X Ray Diffraction 1.8852 1.91 -- 169 3210 0.2153 0.2152 -- 76.0
X Ray Diffraction 1.91 1.9362 -- 176 3340 0.2176 0.2278 -- 79.0
X Ray Diffraction 1.9362 1.9639 -- 186 3485 0.2075 0.2172 -- 83.0
X Ray Diffraction 1.9639 1.9932 -- 205 3623 0.2007 0.2445 -- 86.0
X Ray Diffraction 1.9932 2.0243 -- 208 3798 0.1943 0.2307 -- 89.0
X Ray Diffraction 2.0243 2.0575 -- 220 3898 0.1932 0.2348 -- 92.0
X Ray Diffraction 2.0575 2.093 -- 203 3979 0.1863 0.2191 -- 94.0
X Ray Diffraction 2.093 2.131 -- 230 4023 0.1768 0.228 -- 95.0
X Ray Diffraction 2.131 2.172 -- 226 4064 0.1706 0.1985 -- 96.0
X Ray Diffraction 2.172 2.2164 -- 222 4112 0.1681 0.188 -- 97.0
X Ray Diffraction 2.2164 2.2645 -- 184 4168 0.1728 0.2149 -- 97.0
X Ray Diffraction 2.2645 2.3172 -- 239 4092 0.1774 0.2054 -- 97.0
X Ray Diffraction 2.3172 2.3752 -- 246 4116 0.1676 0.2066 -- 97.0
X Ray Diffraction 2.3752 2.4394 -- 209 4154 0.1748 0.1894 -- 98.0
X Ray Diffraction 2.4394 2.5111 -- 250 4133 0.1752 0.2044 -- 98.0
X Ray Diffraction 2.5111 2.5922 -- 211 4166 0.1884 0.2119 -- 98.0
X Ray Diffraction 2.5922 2.6848 -- 238 4151 0.1742 0.2201 -- 98.0
X Ray Diffraction 2.6848 2.7923 -- 221 4212 0.1764 0.1916 -- 98.0
X Ray Diffraction 2.7923 2.9193 -- 218 4164 0.1747 0.202 -- 98.0
X Ray Diffraction 2.9193 3.0732 -- 207 4229 0.1796 0.2273 -- 98.0
X Ray Diffraction 3.0732 3.2657 -- 188 4218 0.1811 0.2115 -- 99.0
X Ray Diffraction 3.2657 3.5177 -- 234 4228 0.1824 0.2233 -- 99.0
X Ray Diffraction 3.5177 3.8715 -- 231 4218 0.171 0.1904 -- 99.0
X Ray Diffraction 3.8715 4.4311 -- 225 4269 0.1467 0.1739 -- 99.0
X Ray Diffraction 4.4311 5.5806 -- 235 4267 0.1516 0.1717 -- 99.0
X Ray Diffraction 5.5806 41.592 -- 207 4343 0.2036 0.214 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.5021
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -7.885
Anisotropic B[2][2] -7.0101
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.5079
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.102
f_dihedral_angle_d 19.435
f_angle_d 1.07
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8082
Nucleic Acid Atoms 0
Heterogen Atoms 231
Solvent Atoms 847

Software

Computing
Computing Package Purpose
SERGUI Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: dev_755) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_755) refinement
PHASER model building
SERGUI data collection