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X-RAY DIFFRACTION
Materials and Methods page
3U2S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 8% (w/v) PEG 3350, 5% (v/v) 2-methyl-2,4-pentanediol, 90 mM lithium sulfate, 45 mM imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.46 α = 90
    b = 86.57 β = 92.08
    c = 94.88 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-07-11
     
    Diffraction Radiation
    Monochromator Si220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.8
    Resolution(Low) 50
    Number Reflections(All) 134186
    Number Reflections(Observed) 122378
    Percent Possible(Observed) 91.2
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.83
    Percent Possible(All) 64.8
    R Merge I(Observed) 0.438
    Mean I Over Sigma(Observed) 2.0
    Redundancy 2.9
    Number Unique Reflections(All) 4342
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.797
    Resolution(Low) 41.581
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 134464
    Number of Reflections(Observed) 122322
    Number of Reflections(R-Free) 6166
    Percent Reflections(Observed) 90.97
    R-Factor(Observed) 0.1792
    R-Work 0.1779
    R-Free 0.205
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.5021
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -7.885
    Anisotropic B[2][2] -7.0101
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.5079
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7974
    Shell Resolution(Low) 1.8178
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.2777
    R-Factor(R-Free) 0.3172
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8178
    Shell Resolution(Low) 1.8392
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.2685
    Percent Reflections(Observed) 68.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8392
    Shell Resolution(Low) 1.8617
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3008
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.2694
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8617
    Shell Resolution(Low) 1.8852
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3089
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8852
    Shell Resolution(Low) 1.91
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3210
    R-Factor(R-Work) 0.2153
    R-Factor(R-Free) 0.2152
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.91
    Shell Resolution(Low) 1.9362
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3340
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.2278
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9362
    Shell Resolution(Low) 1.9639
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3485
    R-Factor(R-Work) 0.2075
    R-Factor(R-Free) 0.2172
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9639
    Shell Resolution(Low) 1.9932
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3623
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9932
    Shell Resolution(Low) 2.0243
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3798
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0243
    Shell Resolution(Low) 2.0575
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 3898
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0575
    Shell Resolution(Low) 2.093
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3979
    R-Factor(R-Work) 0.1863
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.093
    Shell Resolution(Low) 2.131
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4023
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.131
    Shell Resolution(Low) 2.172
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4064
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.172
    Shell Resolution(Low) 2.2164
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4112
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2164
    Shell Resolution(Low) 2.2645
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 4168
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2645
    Shell Resolution(Low) 2.3172
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4092
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3172
    Shell Resolution(Low) 2.3752
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4116
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3752
    Shell Resolution(Low) 2.4394
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 4154
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.1894
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4394
    Shell Resolution(Low) 2.5111
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4133
    R-Factor(R-Work) 0.1752
    R-Factor(R-Free) 0.2044
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5111
    Shell Resolution(Low) 2.5922
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4166
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2119
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5922
    Shell Resolution(Low) 2.6848
    Number of Reflections(R-Free) 238
    Number of Reflections(R-Work) 4151
    R-Factor(R-Work) 0.1742
    R-Factor(R-Free) 0.2201
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6848
    Shell Resolution(Low) 2.7923
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4212
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7923
    Shell Resolution(Low) 2.9193
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4164
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9193
    Shell Resolution(Low) 3.0732
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 4229
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0732
    Shell Resolution(Low) 3.2657
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 4218
    R-Factor(R-Work) 0.1811
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2657
    Shell Resolution(Low) 3.5177
    Number of Reflections(R-Free) 234
    Number of Reflections(R-Work) 4228
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2233
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5177
    Shell Resolution(Low) 3.8715
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4218
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.1904
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8715
    Shell Resolution(Low) 4.4311
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4269
    R-Factor(R-Work) 0.1467
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4311
    Shell Resolution(Low) 5.5806
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 4267
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.1717
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5806
    Shell Resolution(Low) 41.592
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 4343
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.102
    f_dihedral_angle_d 19.435
    f_angle_d 1.07
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8082
    Nucleic Acid Atoms 0
    Heterogen Atoms 231
    Solvent Atoms 847
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_755)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_755)
    model building PHASER
    data collection SERGUI