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X-RAY DIFFRACTION
Materials and Methods page
3TZA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 279.0
    Details 15.2% PEG4000, 0.1M ammonium sulfate, 0.1M sodium acetate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 279K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.72 α = 90
    b = 61.83 β = 94.09
    c = 92.92 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 99
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 4
    Collection Date 2007-02-22
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-3
    Wavelength List 0.9310
    Site ESRF
    Beamline ID14-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 92.85
    Number Reflections(All) 41312
    Number Reflections(Observed) 41312
    Percent Possible(Observed) 94.9
    R Merge I(Observed) 0.057
    B(Isotropic) From Wilson Plot 23.0
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 78.6
    R Merge I(Observed) 0.253
    Mean I Over Sigma(Observed) 2.9
    R-Sym I(Observed) 0.253
    Redundancy 3.5
    Number Unique Reflections(All) 4978
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 38.209
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 41297
    Number of Reflections(R-Free) 2077
    Percent Reflections(Observed) 94.64
    R-Factor(Observed) 0.1745
    R-Work 0.1715
    R-Free 0.2304
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 26.9196
    Anisotropic B[1][1] 1.2065
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.0636
    Anisotropic B[2][2] -4.1782
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.9717
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9442
    Number of Reflections(Observed) 1953
    Number of Reflections(R-Free) 86
    Number of Reflections(R-Work) 1953
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2941
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9442
    Shell Resolution(Low) 1.9928
    Number of Reflections(Observed) 2298
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2298
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9928
    Shell Resolution(Low) 2.0467
    Number of Reflections(Observed) 2628
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0467
    Shell Resolution(Low) 2.1069
    Number of Reflections(Observed) 2682
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1069
    Shell Resolution(Low) 2.1749
    Number of Reflections(Observed) 2665
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.32
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2526
    Number of Reflections(Observed) 2650
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2526
    Shell Resolution(Low) 2.3428
    Number of Reflections(Observed) 2650
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3428
    Shell Resolution(Low) 2.4494
    Number of Reflections(Observed) 2719
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.2612
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4494
    Shell Resolution(Low) 2.5785
    Number of Reflections(Observed) 2673
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.1735
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5785
    Shell Resolution(Low) 2.7401
    Number of Reflections(Observed) 2694
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7401
    Shell Resolution(Low) 2.9515
    Number of Reflections(Observed) 2704
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9515
    Shell Resolution(Low) 3.2484
    Number of Reflections(Observed) 2743
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.162
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2484
    Shell Resolution(Low) 3.7181
    Number of Reflections(Observed) 2687
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7181
    Shell Resolution(Low) 4.6831
    Number of Reflections(Observed) 2719
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1221
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6831
    Shell Resolution(Low) 38.2172
    Number of Reflections(Observed) 2755
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.1438
    R-Factor(R-Free) 0.1557
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.576
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_angle_d 0.949
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4053
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 632
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction SCALA version: 3.2.25