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X-RAY DIFFRACTION
Materials and Methods page
3TZ9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 10% PEG 20000, 15% glycerol, 100mM MES, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.02 α = 79.6
    b = 63.42 β = 87.89
    c = 74.2 γ = 89.98
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type MARRESEARCH
    Details Dynamically bendable mirror
    Collection Date 2010-05-23
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 1.003900
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.1
    Resolution(Low) 45
    Number Reflections(All) 13657
    Number Reflections(Observed) 12539
    Percent Possible(Observed) 91.8
    R Merge I(Observed) 0.062
    B(Isotropic) From Wilson Plot 43.513
    Redundancy 1.79
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.2
    Percent Possible(All) 93.7
    R Merge I(Observed) 0.205
    Mean I Over Sigma(Observed) 4.0
    Redundancy 1.84
    Number Unique Reflections(All) 1245
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.1
    Resolution(Low) 41.99
    Number of Reflections(all) 13657
    Number of Reflections(Observed) 12538
    Number of Reflections(R-Free) 815
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.2162
    R-Work 0.2115
    R-Free 0.2832
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 53.022
    Anisotropic B[1][1] -1.31
    Anisotropic B[1][2] -0.72
    Anisotropic B[1][3] 0.77
    Anisotropic B[2][2] -3.62
    Anisotropic B[2][3] 0.96
    Anisotropic B[3][3] 4.52
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.18
    Number of Reflections(R-Free) 62
    Number of Reflections(R-Work) 902
    R-Factor(R-Work) 0.316
    R-Factor(R-Free) 0.445
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 1.864
    r_scbond_it 1.139
    r_mcangle_it 0.98
    r_mcbond_it 0.546
    r_symmetry_hbond_refined 0.347
    r_bond_refined_d 0.012
    r_angle_refined_deg 1.363
    r_dihedral_angle_1_deg 6.448
    r_dihedral_angle_2_deg 36.99
    r_dihedral_angle_3_deg 20.492
    r_dihedral_angle_4_deg 20.716
    r_chiral_restr 0.086
    r_gen_planes_refined 0.004
    r_nbd_refined 0.24
    r_nbtor_refined 0.319
    r_xyhbond_nbd_refined 0.164
    r_symmetry_vdw_refined 0.262
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4194
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SLS-Software
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement REFMAC 5.2.0005
     
    Software
    data extraction pdb_extract version: 3.10
    refinement REFMAC5
    molecular replacement Phaser version: 2.1.4
    data reduction Xscale