X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 289.0
Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 127.7 α = 90
b = 127.7 β = 90
c = 73.87 γ = 90
Symmetry
Space Group P 42 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2011-07-16
Diffraction Radiation
Monochromator Protocol
double-crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97926 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50 98.0 0.067 0.044 -- 7.8 24499 23998 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.44 99.4 0.721 0.649 2.19 5.9 1198

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.4 38.524 -- 1.89 24466 23954 1223 97.87 -- 0.206 0.2041 0.2395 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3991 2.4952 -- 142 2455 0.3243 0.3999 -- 98.0
X Ray Diffraction 2.4952 2.6087 -- 124 2522 0.2835 0.3616 -- 99.0
X Ray Diffraction 2.6087 2.7462 -- 142 2502 0.2291 0.3246 -- 98.0
X Ray Diffraction 2.7462 2.9182 -- 131 2516 0.2222 0.2874 -- 99.0
X Ray Diffraction 2.9182 3.1434 -- 141 2496 0.2 0.257 -- 98.0
X Ray Diffraction 3.1434 3.4596 -- 148 2504 0.1943 0.2609 -- 98.0
X Ray Diffraction 3.4596 3.9597 -- 145 2511 0.1999 0.2167 -- 98.0
X Ray Diffraction 3.9597 4.9872 -- 120 2565 0.1705 0.196 -- 97.0
X Ray Diffraction 4.9872 38.529 -- 130 2660 0.2049 0.2063 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -2.4808
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -2.4808
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.9615
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.072
f_dihedral_angle_d 15.151
f_angle_d 1.205
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2512
Nucleic Acid Atoms 0
Heterogen Atoms 41
Solvent Atoms 64

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.1_743) Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
PHENIX version: (phenix.refine: 1.7.1_743) model building
HKL-2000 data collection