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X-RAY DIFFRACTION
Materials and Methods page
3TZ4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 127.95 α = 90
    b = 127.95 β = 90
    c = 73.4 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-06-16
     
    Diffraction Radiation
    Monochromator double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97864
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.25
    Resolution(Low) 50
    Number Reflections(All) 29510
    Number Reflections(Observed) 29447
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.052
    Redundancy 7.9
     
    High Resolution Shell Details
    Resolution(High) 2.25
    Resolution(Low) 2.29
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.932
    Mean I Over Sigma(Observed) 2.48
    R-Sym I(Observed) 0.745
    Redundancy 8.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.25
    Resolution(Low) 45.129
    Cut-off Sigma(F) 1.89
    Number of Reflections(all) 31494
    Number of Reflections(Observed) 29447
    Number of Reflections(R-Free) 1586
    Percent Reflections(Observed) 99.72
    R-Factor(Observed) 0.2021
    R-Work 0.2016
    R-Free 0.2128
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -5.4857
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -5.4857
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 10.9715
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2001
    Shell Resolution(Low) 2.2711
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.3012
    R-Factor(R-Free) 0.3499
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2711
    Shell Resolution(Low) 2.3523
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.2349
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3523
    Shell Resolution(Low) 2.4464
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.2166
    R-Factor(R-Free) 0.2408
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4464
    Shell Resolution(Low) 2.5578
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2178
    R-Factor(R-Free) 0.2802
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5578
    Shell Resolution(Low) 2.6926
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6926
    Shell Resolution(Low) 2.8613
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2139
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8613
    Shell Resolution(Low) 3.0821
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0821
    Shell Resolution(Low) 3.3922
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2334
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3922
    Shell Resolution(Low) 3.8828
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8828
    Shell Resolution(Low) 4.891
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.891
    Shell Resolution(Low) 45.138
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2283
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 13.397
    f_angle_d 1.106
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2496
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 80
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-2000