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X-RAY DIFFRACTION
Materials and Methods page
3TZ2
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.2 α = 90
    b = 128.2 β = 90
    c = 72.11 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details MIRRORS
    Collection Date 2011-04-13
     
    Diffraction Radiation
    Monochromator DOUBLE-CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength 0.97918
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.85
    Resolution(Low) 50
    Number Reflections(Observed) 14403
    Percent Possible(Observed) 98.4
    R Merge I(Observed) 0.061
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 2.85
    Resolution(Low) 2.9
    Percent Possible(All) 88.7
    R Merge I(Observed) 0.903
    Mean I Over Sigma(Observed) 1.8
    R-Sym I(Observed) 0.751
    Redundancy 5.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.85
    Resolution(Low) 38.38
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 14620
    Number of Reflections(Observed) 14365
    Number of Reflections(R-Free) 1438
    Percent Reflections(Observed) 98.3
    R-Factor(Observed) 0.204
    R-Work 0.199
    R-Free 0.242
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -16.742
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -16.742
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 33.484
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8456
    Shell Resolution(Low) 2.9473
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1164
    R-Factor(R-Work) 0.3227
    R-Factor(R-Free) 0.4046
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9473
    Shell Resolution(Low) 3.0653
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1223
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.3084
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0653
    Shell Resolution(Low) 3.2047
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1273
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.3031
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2047
    Shell Resolution(Low) 3.3736
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1285
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3736
    Shell Resolution(Low) 3.5848
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1300
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2953
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5848
    Shell Resolution(Low) 3.8614
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1304
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8614
    Shell Resolution(Low) 4.2495
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1303
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.2213
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2495
    Shell Resolution(Low) 4.8634
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1323
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8634
    Shell Resolution(Low) 6.1233
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1345
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1233
    Shell Resolution(Low) 38.3783
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1407
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2185
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 13.266
    f_angle_d 1.147
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2430
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.REFINE: 1.7.1_743)
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-2000