X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.5
Temperature 289.0
Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 128.2 α = 90
b = 128.2 β = 90
c = 72.11 γ = 90
Symmetry
Space Group P 42 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r MIRRORS 2011-04-13
Diffraction Radiation
Monochromator Protocol
DOUBLE-CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID -- APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.85 50 98.4 0.061 0.044 -- 7.4 -- 14403 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.85 2.9 88.7 0.903 0.751 1.8 5.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.85 38.38 -- 1.33 14620 14365 1438 98.3 -- 0.204 0.199 0.242 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8456 2.9473 -- 130 1164 0.3227 0.4046 -- 90.0
X Ray Diffraction 2.9473 3.0653 -- 135 1223 0.258 0.3084 -- 95.0
X Ray Diffraction 3.0653 3.2047 -- 142 1273 0.232 0.3031 -- 99.0
X Ray Diffraction 3.2047 3.3736 -- 142 1285 0.2145 0.2853 -- 100.0
X Ray Diffraction 3.3736 3.5848 -- 145 1300 0.2028 0.2953 -- 100.0
X Ray Diffraction 3.5848 3.8614 -- 145 1304 0.1958 0.274 -- 100.0
X Ray Diffraction 3.8614 4.2495 -- 145 1303 0.1702 0.2213 -- 100.0
X Ray Diffraction 4.2495 4.8634 -- 147 1323 0.1518 0.1926 -- 100.0
X Ray Diffraction 4.8634 6.1233 -- 149 1345 0.2 0.2515 -- 100.0
X Ray Diffraction 6.1233 38.3783 -- 158 1407 0.2159 0.2185 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -16.742
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -16.742
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 33.484
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.071
f_dihedral_angle_d 13.266
f_angle_d 1.147
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2430
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 0

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (PHENIX.REFINE: 1.7.1_743) Structure Solution
PHENIX (PHENIX.REFINE: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
PHENIX version: (phenix.refine: 1.7.1_743) model building
HKL-2000 data collection