X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.6
Temperature 293.0
Details 30% PEG 4000, 0.1 M sodium acetate pH 4.6 and 0.2 M ammonium acetate, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.13 α = 90
b = 42.15 β = 90
c = 59.97 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
2 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR ADSC QUANTUM 210 -- 2006-10-31
AREA DETECTOR ADSC QUANTUM 210 -- 2006-03-03
Diffraction Radiation
Monochromator Protocol
-- MAD
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 0.97854, 0.9791, 0.974 PHOTON FACTORY AR-NW12A
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1.000 PHOTON FACTORY AR-NW12A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 99.5 0.053 0.053 -- 3.8 8076 8036 -- -3.0 24.87
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.86 97.8 -- 0.266 5.5 3.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.8 28.321 -- 1.38 7950 7950 368 99.35 -- 0.2047 0.203 0.2367 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7987 2.0589 -- 110 2481 0.2078 0.2772 -- 99.0
X Ray Diffraction 2.0589 2.5937 -- 110 2516 0.1797 0.2773 -- 100.0
X Ray Diffraction 2.5937 28.3244 -- 148 2585 0.2115 0.22 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 32.3004
Anisotropic B[1][1] 6.7015
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -10.2534
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.5519
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.082
f_dihedral_angle_d 13.852
f_angle_d 0.978
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 752
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 27

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
SOLVE model building