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X-RAY DIFFRACTION
Materials and Methods page
3TZ1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.6
    Temperature 293.0
    Details 30% PEG 4000, 0.1 M sodium acetate pH 4.6 and 0.2 M ammonium acetate, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 32.13 α = 90
    b = 42.15 β = 90
    c = 59.97 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 95
    Diffrn ID 2
    Data Collection Temperature 95
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 210
    Collection Date 2006-10-31
    Detector AREA DETECTOR
    Type ADSC QUANTUM 210
    Collection Date 2006-03-03
     
    Diffraction Radiation
    Diffraction Protocol MAD
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 0.97854, 0.9791, 0.974
    Site PHOTON FACTORY
    Beamline AR-NW12A
    Source SYNCHROTRON
    Type PHOTON FACTORY BEAMLINE AR-NW12A
    Wavelength List 1.000
    Site PHOTON FACTORY
    Beamline AR-NW12A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.8
    Resolution(Low) 50
    Number Reflections(All) 8076
    Number Reflections(Observed) 8036
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.053
    B(Isotropic) From Wilson Plot 24.87
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.86
    Percent Possible(All) 97.8
    Mean I Over Sigma(Observed) 5.5
    R-Sym I(Observed) 0.266
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.8
    Resolution(Low) 28.321
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 7950
    Number of Reflections(Observed) 7950
    Number of Reflections(R-Free) 368
    Percent Reflections(Observed) 99.35
    R-Factor(Observed) 0.2047
    R-Work 0.203
    R-Free 0.2367
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 32.3004
    Anisotropic B[1][1] 6.7015
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -10.2534
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.5519
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7987
    Shell Resolution(Low) 2.0589
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2481
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2772
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0589
    Shell Resolution(Low) 2.5937
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2516
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5937
    Shell Resolution(Low) 28.3244
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.22
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 13.852
    f_angle_d 0.978
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 752
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 27
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building SOLVE