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X-RAY DIFFRACTION
Materials and Methods page
3TZ0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 289.0
    Details 14% peg8000, 0.1 M Tris, pH8.5, 1.2 M NaCl, 125mM KCl, 150mM Arg-HCl,20mM MgCl2, 5% glycerol , pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.8 α = 90
    b = 128.8 β = 90
    c = 72.91 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-08-31
     
    Diffraction Radiation
    Monochromator double-crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97926
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 21812
    Number Reflections(Observed) 21439
    Percent Possible(Observed) 98.3
    R Merge I(Observed) 0.05
    Redundancy 7.9
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 98.2
    R Merge I(Observed) 0.711
    Mean I Over Sigma(Observed) 2.24
    R-Sym I(Observed) 0.661
    Redundancy 6.6
    Number Unique Reflections(All) 1046
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 45.199
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 21792
    Number of Reflections(Observed) 21408
    Number of Reflections(R-Free) 1997
    Percent Reflections(Observed) 98.24
    R-Factor(Observed) 0.2072
    R-Work 0.2039
    R-Free 0.2398
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.2781
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.2781
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.5563
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5
    Shell Resolution(Low) 2.5625
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1353
    R-Factor(R-Work) 0.3011
    R-Factor(R-Free) 0.3575
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5625
    Shell Resolution(Low) 2.6318
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1356
    R-Factor(R-Work) 0.2791
    R-Factor(R-Free) 0.3531
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6318
    Shell Resolution(Low) 2.7092
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1365
    R-Factor(R-Work) 0.2367
    R-Factor(R-Free) 0.301
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7092
    Shell Resolution(Low) 2.7966
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1393
    R-Factor(R-Work) 0.2358
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7966
    Shell Resolution(Low) 2.8966
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1364
    R-Factor(R-Work) 0.249
    R-Factor(R-Free) 0.3107
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8966
    Shell Resolution(Low) 3.0125
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1380
    R-Factor(R-Work) 0.2219
    R-Factor(R-Free) 0.3129
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0125
    Shell Resolution(Low) 3.1496
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1378
    R-Factor(R-Work) 0.2175
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1496
    Shell Resolution(Low) 3.3156
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1379
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3156
    Shell Resolution(Low) 3.5232
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1381
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2439
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5232
    Shell Resolution(Low) 3.7951
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1404
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2382
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7951
    Shell Resolution(Low) 4.1768
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1370
    R-Factor(R-Work) 0.189
    R-Factor(R-Free) 0.2511
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1768
    Shell Resolution(Low) 4.7806
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1404
    R-Factor(R-Work) 0.17
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7806
    Shell Resolution(Low) 6.0209
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1401
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2141
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0209
    Shell Resolution(Low) 45.2064
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1483
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 12.657
    f_angle_d 1.096
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2437
    Nucleic Acid Atoms 0
    Heterogen Atoms 9
    Solvent Atoms 21
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-2000