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X-RAY DIFFRACTION
Materials and Methods page
3TY9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.1
    Temperature 295.0
    Details HEPES buffer 20% (v/v) Hexylene Glycol, pH 7.1, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 95.5 α = 90
    b = 132.76 β = 90
    c = 162.77 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 130
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details See Beamline Documentation
    Collection Date 2011-02-15
     
    Diffraction Radiation
    Monochromator See Beamline Documentation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.12
    Resolution(Low) 50
    Number Reflections(All) 37602
    Number Reflections(Observed) 37527
    Percent Possible(Observed) 99.8
    Redundancy 7.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.12
    Resolution(Low) 41.185
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 37457
    Number of Reflections(R-Free) 1669
    Percent Reflections(Observed) 99.78
    R-Factor(Observed) 0.221
    R-Work 0.2189
    R-Free 0.2663
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 51.8235
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -22.0948
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -21.6232
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.12
    Shell Resolution(Low) 3.2118
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2941
    R-Factor(R-Work) 0.3759
    R-Factor(R-Free) 0.4149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2118
    Shell Resolution(Low) 3.3154
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2948
    R-Factor(R-Work) 0.3443
    R-Factor(R-Free) 0.373
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3154
    Shell Resolution(Low) 3.4339
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2940
    R-Factor(R-Work) 0.305
    R-Factor(R-Free) 0.3665
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4339
    Shell Resolution(Low) 3.5713
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2945
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5713
    Shell Resolution(Low) 3.7337
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2933
    R-Factor(R-Work) 0.2432
    R-Factor(R-Free) 0.3013
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7337
    Shell Resolution(Low) 3.9304
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2962
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2737
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9304
    Shell Resolution(Low) 4.1764
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2985
    R-Factor(R-Work) 0.2073
    R-Factor(R-Free) 0.2785
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1764
    Shell Resolution(Low) 4.4985
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.2577
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4985
    Shell Resolution(Low) 4.9506
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2989
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9506
    Shell Resolution(Low) 5.6653
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2995
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6653
    Shell Resolution(Low) 7.1317
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3034
    R-Factor(R-Work) 0.226
    R-Factor(R-Free) 0.2837
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.1317
    Shell Resolution(Low) 41.1882
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3151
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2211
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.059
    f_dihedral_angle_d 15.174
    f_angle_d 0.851
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 12022
    Nucleic Acid Atoms 0
    Heterogen Atoms 226
    Solvent Atoms 52
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHENIX
    data collection CBASS