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X-RAY DIFFRACTION
Materials and Methods page
3TY8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 295.0
    Details 0.2-0.25 M di-ammoinium tartrate and 20% (w/v) Polyethylene Glycol 3350, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.14 α = 90
    b = 94.16 β = 95.78
    c = 76.03 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 130
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details See Beamline Documentation
    Collection Date 2011-02-15
     
    Diffraction Radiation
    Monochromator See Beamline Documendation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.0
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(All) 25967
    Number Reflections(Observed) 25811
    Percent Possible(Observed) 99.4
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 37.82
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 25038
    Number of Reflections(R-Free) 1249
    Percent Reflections(Observed) 96.12
    R-Factor(Observed) 0.1978
    R-Work 0.1954
    R-Free 0.2415
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0216
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 9.8611
    Anisotropic B[2][2] 14.0167
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -13.1151
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6001
    Shell Resolution(Low) 2.7041
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2342
    R-Factor(R-Work) 0.2991
    R-Factor(R-Free) 0.3784
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7041
    Shell Resolution(Low) 2.8272
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.2776
    R-Factor(R-Free) 0.3317
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8272
    Shell Resolution(Low) 2.9762
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.2398
    R-Factor(R-Free) 0.3347
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9762
    Shell Resolution(Low) 3.1625
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2269
    R-Factor(R-Free) 0.2463
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1625
    Shell Resolution(Low) 3.4066
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4066
    Shell Resolution(Low) 3.7491
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7491
    Shell Resolution(Low) 4.291
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1712
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.291
    Shell Resolution(Low) 5.4037
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.2128
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4037
    Shell Resolution(Low) 37.8236
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2791
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2019
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 15.309
    f_angle_d 0.874
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6046
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 115
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHENIX
    data collection CBASS