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X-RAY DIFFRACTION
Materials and Methods page
3TY5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 295.0
    Details 0.2-0.25 M di-ammoinium tartrate and 20% (w/v) Polyethylene Glycol 3350, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.99 α = 90
    b = 94.38 β = 93.51
    c = 75.31 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 130
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details See Beamline Documentation
    Collection Date 2011-02-15
     
    Diffraction Radiation
    Monochromator See Beamline Documentation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 30993
    Percent Possible(Observed) 99.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.4
    Resolution(Low) 44.33
    Cut-off Sigma(F) 1.37
    Number of Reflections(Observed) 33879
    Number of Reflections(R-Free) 1728
    Percent Reflections(Observed) 96.7
    R-Factor(Observed) 0.18
    R-Work 0.1776
    R-Free 0.2247
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.1058
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 7.7062
    Anisotropic B[2][2] 0.7172
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.823
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4002
    Shell Resolution(Low) 2.4708
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2078
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3344
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4708
    Shell Resolution(Low) 2.5505
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2400
    R-Factor(R-Work) 0.28
    R-Factor(R-Free) 0.3519
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5505
    Shell Resolution(Low) 2.6417
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2758
    R-Factor(R-Free) 0.3687
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6417
    Shell Resolution(Low) 2.7474
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2439
    R-Factor(R-Free) 0.3244
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7474
    Shell Resolution(Low) 2.8724
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.2322
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8724
    Shell Resolution(Low) 3.0238
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2778
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2815
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0238
    Shell Resolution(Low) 3.2132
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2132
    Shell Resolution(Low) 3.4613
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4613
    Shell Resolution(Low) 3.8094
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8094
    Shell Resolution(Low) 4.3602
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3602
    Shell Resolution(Low) 5.4918
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.1358
    R-Factor(R-Free) 0.1652
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4918
    Shell Resolution(Low) 44.3377
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2846
    R-Factor(R-Work) 0.1648
    R-Factor(R-Free) 0.2042
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 14.13
    f_angle_d 1.102
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6100
    Nucleic Acid Atoms 0
    Heterogen Atoms 68
    Solvent Atoms 213
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHENIX
    data collection CBASS