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X-RAY DIFFRACTION
Materials and Methods page
3TXZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 277.0
    Details 0.2M MgCl2, 0.1M HEPES, 30-40% PEG400, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 141.36 α = 90
    b = 141.36 β = 90
    c = 42.69 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2011-09-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 0.99
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.5
    Resolution(Low) 45
    Number Reflections(Observed) 48165
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.065
    Mean I Over Sigma(Observed) 41.0
    R-Sym I(Observed) 0.58
    Redundancy 9.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.7
    Resolution(Low) 45.0
    Cut-off Sigma(F) 1.37
    Number of Reflections(Observed) 48163
    Number of Reflections(R-Free) 4817
    Percent Reflections(Observed) 99.99
    R-Factor(Observed) 0.1635
    R-Work 0.161
    R-Free 0.1858
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.7283
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.7283
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.4565
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7003
    Shell Resolution(Low) 1.7196
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.2401
    R-Factor(R-Free) 0.3074
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7196
    Shell Resolution(Low) 1.7399
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1398
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7399
    Shell Resolution(Low) 1.7611
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1414
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7611
    Shell Resolution(Low) 1.7834
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1441
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.2111
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7834
    Shell Resolution(Low) 1.8069
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1393
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8069
    Shell Resolution(Low) 1.8316
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 1420
    R-Factor(R-Work) 0.1734
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8316
    Shell Resolution(Low) 1.8578
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1451
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8578
    Shell Resolution(Low) 1.8855
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1399
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8855
    Shell Resolution(Low) 1.915
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1431
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.915
    Shell Resolution(Low) 1.9464
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1445
    R-Factor(R-Work) 0.1534
    R-Factor(R-Free) 0.2017
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9464
    Shell Resolution(Low) 1.9799
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1397
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.1817
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9799
    Shell Resolution(Low) 2.0159
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1448
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0159
    Shell Resolution(Low) 2.0547
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1417
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0547
    Shell Resolution(Low) 2.0967
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1419
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0967
    Shell Resolution(Low) 2.1422
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1458
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1422
    Shell Resolution(Low) 2.1921
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1407
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1921
    Shell Resolution(Low) 2.2469
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1468
    R-Factor(R-Work) 0.1431
    R-Factor(R-Free) 0.1706
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2469
    Shell Resolution(Low) 2.3076
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1406
    R-Factor(R-Work) 0.1523
    R-Factor(R-Free) 0.2049
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3076
    Shell Resolution(Low) 2.3756
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1443
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3756
    Shell Resolution(Low) 2.4522
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 1431
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4522
    Shell Resolution(Low) 2.5399
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1460
    R-Factor(R-Work) 0.1494
    R-Factor(R-Free) 0.1797
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5399
    Shell Resolution(Low) 2.6416
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1451
    R-Factor(R-Work) 0.1475
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6416
    Shell Resolution(Low) 2.7618
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1433
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7618
    Shell Resolution(Low) 2.9074
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1456
    R-Factor(R-Work) 0.1518
    R-Factor(R-Free) 0.1929
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9074
    Shell Resolution(Low) 3.0895
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1467
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.171
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0895
    Shell Resolution(Low) 3.328
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 1464
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.328
    Shell Resolution(Low) 3.6628
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 1474
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.155
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6628
    Shell Resolution(Low) 4.1926
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 1492
    R-Factor(R-Work) 0.1523
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1926
    Shell Resolution(Low) 5.2813
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 1518
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.1584
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2813
    Shell Resolution(Low) 50.0006
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 1604
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.076
    f_dihedral_angle_d 14.681
    f_angle_d 1.005
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3173
    Nucleic Acid Atoms 0
    Heterogen Atoms 43
    Solvent Atoms 368
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: dev_845)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_862)
    model building AMoRE
    data collection HKL-3000