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X-RAY DIFFRACTION
Materials and Methods page
3TS4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9
    Temperature 293.0
    Details MMP12 AT 0.4 mM co-crystallization, with 100mM AHA and non-chelating inhibitor EEG at 1.1 mM with reservoir: 27% PEG 10K, 0.1M glycine. AHA removed during cryo-soak for 5 min in 30% MPEG2K, 10% ethylene glycol, 200 mM imidazole malate, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.09 α = 90
    b = 63.65 β = 90
    c = 37.37 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details bent cylindrical mirror
    Collection Date 2009-07-20
     
    Diffraction Radiation
    Monochromator horizontally diffracting Si (111) monochromator and Pt coated mirrors in Kirkpatrick-Baez geometry for focusing
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.99190
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.59
    Resolution(Low) 33
    Number Reflections(All) 23301
    Number Reflections(Observed) 23208
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.099
    B(Isotropic) From Wilson Plot 25.7
    Redundancy 7.67
     
    High Resolution Shell Details
    Resolution(High) 1.59
    Resolution(Low) 1.68
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.632
    Mean I Over Sigma(Observed) 2.89
    R-Sym I(Observed) 0.805
    Redundancy 7.58
    Number Unique Reflections(All) 3687
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.587
    Resolution(Low) 32.976
    Cut-off Sigma(F) 2.01
    Number of Reflections(all) 23295
    Number of Reflections(Observed) 23181
    Number of Reflections(R-Free) 1160
    Percent Reflections(Observed) 99.51
    R-Factor(Observed) 0.1797
    R-Work 0.1784
    R-Free 0.203
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model anisotropic (TLS)
    Anisotropic B[1][1] 0.3654
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1928
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1726
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5871
    Shell Resolution(Low) 1.6594
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.2762
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6594
    Shell Resolution(Low) 1.7468
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.2571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7468
    Shell Resolution(Low) 1.8563
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8563
    Shell Resolution(Low) 1.9996
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9996
    Shell Resolution(Low) 2.2008
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2008
    Shell Resolution(Low) 2.5191
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5191
    Shell Resolution(Low) 3.1734
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2806
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1734
    Shell Resolution(Low) 32.9828
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.095
    f_dihedral_angle_d 18.681
    f_angle_d 1.612
    f_bond_d 0.016
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1246
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 213
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building MOLREP
    data collection DNA