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X-RAY DIFFRACTION
Materials and Methods page
3TLK
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 293.0
    Details 1.0M Succinic acid pH 7.0, 0.1M HEPES, 1% w/v Polyethylene glycol monomethyl ether 2000, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.02 α = 90
    b = 131.59 β = 90
    c = 196.11 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-01-31
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9792
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.85
    Resolution(Low) 50
    Number Reflections(All) 79154
    Number Reflections(Observed) 79154
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.104
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.92
    Percent Possible(All) 90.1
    R Merge I(Observed) 0.421
    Mean I Over Sigma(Observed) 3.07
    R-Sym I(Observed) 0.421
    Redundancy 5.2
    Number Unique Reflections(All) 7255
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.853
    Resolution(Low) 39.314
    Cut-off Sigma(F) 0.04
    Number of Reflections(all) 74245
    Number of Reflections(Observed) 74245
    Number of Reflections(R-Free) 1859
    Percent Reflections(Observed) 91.11
    R-Factor(All) 0.1802
    R-Factor(Observed) 0.1802
    R-Work 0.1793
    R-Free 0.2168
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.108
    Anisotropic B[1][1] 9.9525
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.2166
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.7359
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8526
    Shell Resolution(Low) 1.9026
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 4563
    R-Factor(R-Work) 0.1993
    R-Factor(R-Free) 0.2531
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9026
    Shell Resolution(Low) 1.9586
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 4881
    R-Factor(R-Work) 0.1959
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9586
    Shell Resolution(Low) 2.0218
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 5054
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2745
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0218
    Shell Resolution(Low) 2.0941
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5265
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0941
    Shell Resolution(Low) 2.1779
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 5339
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1779
    Shell Resolution(Low) 2.2771
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5543
    R-Factor(R-Work) 0.1809
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2771
    Shell Resolution(Low) 2.3971
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 5647
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3971
    Shell Resolution(Low) 2.5473
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 5747
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5473
    Shell Resolution(Low) 2.7439
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 5868
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2396
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7439
    Shell Resolution(Low) 3.0199
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 5960
    R-Factor(R-Work) 0.1908
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0199
    Shell Resolution(Low) 3.4567
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6017
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4567
    Shell Resolution(Low) 4.3542
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 6137
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3542
    Shell Resolution(Low) 39.3226
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 6365
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.1666
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.013
    f_chiral_restr 0.106
    f_dihedral_angle_d 25.867
    f_angle_d 1.28
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6742
    Nucleic Acid Atoms 0
    Heterogen Atoms 214
    Solvent Atoms 616
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.5_2)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.5_2)
    model building Phaser
    data collection MAR345dtb