X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 293.0
Details 1.0M Succinic acid pH 7.0, 0.1M HEPES, 1% w/v Polyethylene glycol monomethyl ether 2000, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 74.02 α = 90
b = 131.59 β = 90
c = 196.11 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2010-01-31
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9792 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50 99.9 0.104 0.104 -- 6.7 79154 79154 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.92 90.1 0.421 0.421 3.07 5.2 7255

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.853 39.314 -- 0.04 74245 74245 1859 91.11 0.1802 0.1802 0.1793 0.2168 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8526 1.9026 -- 113 4563 0.1993 0.2531 -- 76.0
X Ray Diffraction 1.9026 1.9586 -- 127 4881 0.1959 0.2645 -- 81.0
X Ray Diffraction 1.9586 2.0218 -- 129 5054 0.2015 0.2745 -- 84.0
X Ray Diffraction 2.0218 2.0941 -- 144 5265 0.1868 0.2457 -- 87.0
X Ray Diffraction 2.0941 2.1779 -- 144 5339 0.1852 0.1979 -- 88.0
X Ray Diffraction 2.1779 2.2771 -- 145 5543 0.1809 0.2429 -- 91.0
X Ray Diffraction 2.2771 2.3971 -- 137 5647 0.1968 0.2303 -- 93.0
X Ray Diffraction 2.3971 2.5473 -- 155 5747 0.1933 0.2524 -- 94.0
X Ray Diffraction 2.5473 2.7439 -- 149 5868 0.1919 0.2396 -- 96.0
X Ray Diffraction 2.7439 3.0199 -- 155 5960 0.1908 0.2286 -- 97.0
X Ray Diffraction 3.0199 3.4567 -- 146 6017 0.1789 0.203 -- 98.0
X Ray Diffraction 3.4567 4.3542 -- 157 6137 0.1555 0.1971 -- 99.0
X Ray Diffraction 4.3542 39.3226 -- 158 6365 0.1658 0.1666 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 28.108
Anisotropic B[1][1] 9.9525
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -7.2166
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.7359
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.013
f_chiral_restr 0.106
f_dihedral_angle_d 25.867
f_angle_d 1.28
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6742
Nucleic Acid Atoms 0
Heterogen Atoms 214
Solvent Atoms 616

Software

Computing
Computing Package Purpose
MAR345dtb Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.5_2) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.5_2) refinement
Phaser model building
MAR345dtb data collection