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X-RAY DIFFRACTION
Materials and Methods page
3THF
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion
    pH 6
    Temperature 277.0
    Details K/Na tartrate, sodium thiocynate, glycerol, pH 6.0, vapor diffusion, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.8 α = 90
    b = 85.63 β = 90
    c = 92.98 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Details Meridionally-bent fused silica mirror
    Collection Date 2011-07-22
    Detector CCD
    Type ADSC QUANTUM
    Collection Date 2009-06-04
     
    Diffraction Radiation
    Monochromator Double silicon(111) crystal
    Diffraction Protocol Single Wavelength
    Monochromator Double silicon(111) crystal
    Diffraction Protocol Single Wavelength
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1
    Site NSLS
    Beamline X25
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.9792
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.69
    Resolution(Low) 50
    Number Reflections(All) 16922
    Number Reflections(Observed) 16446
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.069
    B(Isotropic) From Wilson Plot 77.2
    Redundancy 8.5
     
    High Resolution Shell Details
    Resolution(High) 2.695
    Resolution(Low) 2.75
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.463
    Redundancy 8.1
    Number Unique Reflections(All) 815
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.6951
    Resolution(Low) 47.633
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 16370
    Number of Reflections(Observed) 15941
    Number of Reflections(R-Free) 1157
    Percent Reflections(Observed) 95.92
    R-Factor(All) 0.2317
    R-Factor(Observed) 0.2317
    R-Work 0.2278
    R-Free 0.2838
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 75.6584
    Anisotropic B[1][1] 20.0033
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 11.3694
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -31.3727
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6951
    Shell Resolution(Low) 2.8177
    Number of Reflections(Observed) 1530
    Number of Reflections(R-Free) 119
    R-Factor(R-Work) 0.42
    R-Factor(R-Free) 0.5162
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8177
    Shell Resolution(Low) 2.9622
    Number of Reflections(Observed) 1781
    Number of Reflections(R-Free) 141
    R-Factor(R-Work) 0.295
    R-Factor(R-Free) 0.3803
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9622
    Shell Resolution(Low) 3.152
    Number of Reflections(Observed) 1801
    Number of Reflections(R-Free) 153
    R-Factor(R-Work) 0.2615
    R-Factor(R-Free) 0.339
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.152
    Shell Resolution(Low) 3.3953
    Number of Reflections(Observed) 1868
    Number of Reflections(R-Free) 136
    R-Factor(R-Work) 0.2514
    R-Factor(R-Free) 0.3059
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3953
    Shell Resolution(Low) 3.7369
    Number of Reflections(Observed) 1892
    Number of Reflections(R-Free) 165
    R-Factor(R-Work) 0.2329
    R-Factor(R-Free) 0.2927
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7369
    Shell Resolution(Low) 4.2774
    Number of Reflections(Observed) 1914
    Number of Reflections(R-Free) 154
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2492
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2774
    Shell Resolution(Low) 5.3878
    Number of Reflections(Observed) 1941
    Number of Reflections(R-Free) 149
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2187
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3878
    Shell Resolution(Low) 47.6399
    Number of Reflections(Observed) 2057
    Number of Reflections(R-Free) 144
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2872
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    flanairty 0.001
    fhirality 0.041
    f_dihedral_angle_d 16.731
    f_bond_d 0.1
    f_angle_deg 0.6
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2749
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SHELXD
    Structure Refinement PHENIX (phenix.refine: 1.6.2_432)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement REFMAC5
    phasing SHELX
    data reduction SCALEPACK
    data collection DENZO