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X-RAY DIFFRACTION
Materials and Methods page
3TGT
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 14% PEG 1500, 12% PEG 400, 0.1M HEPES, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 7.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.56 α = 90
    b = 66.94 β = 90
    c = 88.03 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2010-07-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 32465
    Number Reflections(Observed) 30907
    Percent Possible(Observed) 95.2
    R Merge I(Observed) 0.084
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 86.5
    R Merge I(Observed) 0.615
    Mean I Over Sigma(Observed) 2.1
    R-Sym I(Observed) 0.555
    Redundancy 5.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 24.571
    Cut-off Sigma(F) 0.11
    Number of Reflections(all) 31824
    Number of Reflections(Observed) 29250
    Number of Reflections(R-Free) 1437
    Percent Reflections(Observed) 91.91
    R-Factor(Observed) 0.191
    R-Work 0.189
    R-Free 0.2307
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 10.722
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.9969
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.7251
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8676
    Shell Resolution(Low) 1.9343
    Number of Reflections(R-Free) 83
    Number of Reflections(R-Work) 1817
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.2307
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9343
    Shell Resolution(Low) 2.0117
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2475
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.276
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0117
    Shell Resolution(Low) 2.1032
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.2093
    R-Factor(R-Free) 0.313
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1032
    Shell Resolution(Low) 2.214
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.214
    Shell Resolution(Low) 2.3526
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2858
    R-Factor(R-Work) 0.197
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3526
    Shell Resolution(Low) 2.5341
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2896
    R-Factor(R-Work) 0.2037
    R-Factor(R-Free) 0.244
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5341
    Shell Resolution(Low) 2.7888
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2953
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2692
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7888
    Shell Resolution(Low) 3.1916
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3038
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.2095
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1916
    Shell Resolution(Low) 4.0182
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3055
    R-Factor(R-Work) 0.1776
    R-Factor(R-Free) 0.2326
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0182
    Shell Resolution(Low) 24.5735
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3190
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.1972
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.937
    f_angle_d 1.198
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2677
    Nucleic Acid Atoms 0
    Heterogen Atoms 155
    Solvent Atoms 148
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Structure Refinement PHENIX (phenix.refine: 1.6.1_357)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix