X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 14% PEG 1500, 12% PEG 400, 0.1M HEPES, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.56 α = 90
b = 66.94 β = 90
c = 88.03 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2010-07-16
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 95.2 0.084 0.074 -- 6.8 32465 30907 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.93 86.5 0.615 0.555 2.1 5.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 24.571 -- 0.11 31824 29250 1437 91.91 -- 0.191 0.189 0.2307 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8676 1.9343 -- 83 1817 0.2349 0.2307 -- 61.0
X Ray Diffraction 1.9343 2.0117 -- 152 2475 0.2176 0.276 -- 84.0
X Ray Diffraction 2.0117 2.1032 -- 166 2717 0.2093 0.313 -- 92.0
X Ray Diffraction 2.1032 2.214 -- 144 2814 0.2029 0.261 -- 94.0
X Ray Diffraction 2.214 2.3526 -- 141 2858 0.197 0.256 -- 95.0
X Ray Diffraction 2.3526 2.5341 -- 158 2896 0.2037 0.244 -- 97.0
X Ray Diffraction 2.5341 2.7888 -- 152 2953 0.1966 0.2692 -- 98.0
X Ray Diffraction 2.7888 3.1916 -- 142 3038 0.1973 0.2095 -- 99.0
X Ray Diffraction 3.1916 4.0182 -- 145 3055 0.1776 0.2326 -- 99.0
X Ray Diffraction 4.0182 24.5735 -- 154 3190 0.1747 0.1972 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 10.722
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -4.9969
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.7251
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.198
f_dihedral_angle_d 15.937
f_plane_restr 0.004
f_bond_d 0.007
f_chiral_restr 0.069
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2677
Nucleic Acid Atoms 0
Heterogen Atoms 155
Solvent Atoms 148

Software

Software
Software Name Purpose
PHENIX refinement version: 1.6.1_357
PDB_EXTRACT data extraction version: 3.10
HKL data reduction