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X-RAY DIFFRACTION
Materials and Methods page
3TGQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 16% PEG 3350, 0.1M CaCl2, 0.1M Tris-HCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K, pH 7.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 222.97 α = 90
    b = 222.97 β = 90
    c = 86.48 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2008-11-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.77
    Resolution(Low) 48.27
    Number Reflections(All) 63180
    Number Reflections(Observed) 39993
    Percent Possible(Observed) 63.3
    R Merge I(Observed) 0.13
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 2.75
    Resolution(Low) 2.85
    Percent Possible(All) 12.0
    R Merge I(Observed) 0.456
    Mean I Over Sigma(Observed) 1.2
    R-Sym I(Observed) 0.61
    Redundancy 1.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.4
    Resolution(Low) 48.27
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 62593
    Number of Reflections(Observed) 31870
    Number of Reflections(R-Free) 1520
    Percent Reflections(Observed) 93.64
    R-Factor(Observed) 0.2805
    R-Work 0.2796
    R-Free 0.313
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -17.8341
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -17.8341
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -17.8485
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4004
    Shell Resolution(Low) 3.5098
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 2028
    R-Factor(R-Work) 0.3313
    R-Factor(R-Free) 0.3804
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5098
    Shell Resolution(Low) 3.6349
    Number of Reflections(R-Free) 83
    Number of Reflections(R-Work) 2344
    R-Factor(R-Work) 0.3219
    R-Factor(R-Free) 0.3387
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6349
    Shell Resolution(Low) 3.78
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2975
    R-Factor(R-Free) 0.333
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.78
    Shell Resolution(Low) 3.9515
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.2858
    R-Factor(R-Free) 0.3227
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9515
    Shell Resolution(Low) 4.159
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2866
    R-Factor(R-Work) 0.2748
    R-Factor(R-Free) 0.3276
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.159
    Shell Resolution(Low) 4.4183
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2933
    R-Factor(R-Work) 0.2486
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4183
    Shell Resolution(Low) 4.7574
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.2427
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7574
    Shell Resolution(Low) 5.2325
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2325
    Shell Resolution(Low) 5.9812
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2958
    R-Factor(R-Work) 0.281
    R-Factor(R-Free) 0.3013
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9812
    Shell Resolution(Low) 7.504
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2984
    R-Factor(R-Work) 0.3062
    R-Factor(R-Free) 0.3912
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.504
    Shell Resolution(Low) 25.5771
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3014
    R-Factor(R-Work) 0.2747
    R-Factor(R-Free) 0.3204
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.04
    f_dihedral_angle_d 12.585
    f_angle_d 0.916
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10548
    Nucleic Acid Atoms 0
    Heterogen Atoms 350
    Solvent Atoms 93
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix