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X-RAY DIFFRACTION
Materials and Methods page
3TCL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 20% PEG 8000, 3% MPD, 0.1M imidazole, , pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.36 α = 90
    b = 74.23 β = 90
    c = 183.57 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-06-06
     
    Diffraction Radiation
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.000
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 79061
    Number Reflections(Observed) 78982
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 99.7
    R Merge I(Observed) 0.496
    Mean I Over Sigma(Observed) 3.0
    Redundancy 5.0
    Number Unique Reflections(All) 3892
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.906
    Resolution(Low) 39.703
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 79201
    Number of Reflections(Observed) 78886
    Number of Reflections(R-Free) 3961
    Percent Reflections(Observed) 99.83
    R-Factor(All) 0.1977
    R-Factor(Observed) 0.1977
    R-Work 0.1956
    R-Free 0.2383
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 2.8215
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 4.4015
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.223
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9063
    Shell Resolution(Low) 1.9296
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.2622
    R-Factor(R-Free) 0.3621
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9296
    Shell Resolution(Low) 1.954
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.2498
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.954
    Shell Resolution(Low) 1.9797
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2916
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9797
    Shell Resolution(Low) 2.0068
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0068
    Shell Resolution(Low) 2.0355
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.227
    R-Factor(R-Free) 0.2872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0355
    Shell Resolution(Low) 2.0659
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0659
    Shell Resolution(Low) 2.0982
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.3162
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0982
    Shell Resolution(Low) 2.1326
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.3342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1326
    Shell Resolution(Low) 2.1693
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2908
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1693
    Shell Resolution(Low) 2.2088
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2088
    Shell Resolution(Low) 2.2513
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.2643
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2513
    Shell Resolution(Low) 2.2972
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2556
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2972
    Shell Resolution(Low) 2.3472
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3472
    Shell Resolution(Low) 2.4018
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2635
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4018
    Shell Resolution(Low) 2.4618
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4618
    Shell Resolution(Low) 2.5284
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2726
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5284
    Shell Resolution(Low) 2.6027
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1948
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6027
    Shell Resolution(Low) 2.6867
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2335
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6867
    Shell Resolution(Low) 2.7827
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7827
    Shell Resolution(Low) 2.8941
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2843
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8941
    Shell Resolution(Low) 3.0258
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0258
    Shell Resolution(Low) 3.1853
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1899
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1853
    Shell Resolution(Low) 3.3847
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.2249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3847
    Shell Resolution(Low) 3.6459
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.1886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6459
    Shell Resolution(Low) 4.0125
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2067
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0125
    Shell Resolution(Low) 4.5924
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.1915
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5924
    Shell Resolution(Low) 5.783
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2750
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.783
    Shell Resolution(Low) 39.7116
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.2281
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.093
    f_dihedral_angle_d 12.899
    f_angle_d 1.387
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6795
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 623
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_755)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_755)
    model building PHASER
    data collection SERGUI