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X-RAY DIFFRACTION
Materials and Methods page
3T8H
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.8 α = 90
    b = 92.8 β = 90
    c = 130.1 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.45
    Resolution(Low) 50
    Number Reflections(All) 58688
    Number Reflections(Observed) 58688
    Percent Possible(Observed) 99.5
    Redundancy 5.8
     
    High Resolution Shell Details
    Resolution(High) 1.45
    Resolution(Low) 1.48
    Percent Possible(All) 99.1
    Mean I Over Sigma(Observed) 4.6
    R-Sym I(Observed) 0.0363
    Redundancy 5.7
    Number Unique Reflections(All) 2866
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.45
    Resolution(Low) 40.184
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 59481
    Number of Reflections(Observed) 56621
    Number of Reflections(R-Free) 2860
    Percent Reflections(Observed) 95.86
    R-Factor(All) 0.1242
    R-Factor(Observed) 0.1242
    R-Work 0.1227
    R-Free 0.153
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.0657
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.0657
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.1315
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4501
    Shell Resolution(Low) 1.4751
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2305
    R-Factor(R-Work) 0.1503
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4751
    Shell Resolution(Low) 1.5019
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2479
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5019
    Shell Resolution(Low) 1.5308
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.1353
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5308
    Shell Resolution(Low) 1.5621
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.1232
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5621
    Shell Resolution(Low) 1.596
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1107
    R-Factor(R-Free) 0.1491
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.596
    Shell Resolution(Low) 1.6332
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.1038
    R-Factor(R-Free) 0.1556
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6332
    Shell Resolution(Low) 1.674
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.0965
    R-Factor(R-Free) 0.1479
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.674
    Shell Resolution(Low) 1.7193
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.0968
    R-Factor(R-Free) 0.145
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7193
    Shell Resolution(Low) 1.7698
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.0937
    R-Factor(R-Free) 0.1169
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7698
    Shell Resolution(Low) 1.827
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.0945
    R-Factor(R-Free) 0.1405
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.827
    Shell Resolution(Low) 1.8923
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.0999
    R-Factor(R-Free) 0.1334
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8923
    Shell Resolution(Low) 1.968
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.1048
    R-Factor(R-Free) 0.1556
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.968
    Shell Resolution(Low) 2.0576
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2762
    R-Factor(R-Work) 0.1133
    R-Factor(R-Free) 0.1535
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0576
    Shell Resolution(Low) 2.1661
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2777
    R-Factor(R-Work) 0.1132
    R-Factor(R-Free) 0.1443
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1661
    Shell Resolution(Low) 2.3018
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.1131
    R-Factor(R-Free) 0.1532
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3018
    Shell Resolution(Low) 2.4795
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2799
    R-Factor(R-Work) 0.1154
    R-Factor(R-Free) 0.1322
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4795
    Shell Resolution(Low) 2.7289
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2815
    R-Factor(R-Work) 0.1252
    R-Factor(R-Free) 0.1463
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7289
    Shell Resolution(Low) 3.1237
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2844
    R-Factor(R-Work) 0.1361
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1237
    Shell Resolution(Low) 3.935
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.1294
    R-Factor(R-Free) 0.1537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.935
    Shell Resolution(Low) 40.199
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3016
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.1615
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.785
    f_angle_d 1.047
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2424
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 446
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb