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X-RAY DIFFRACTION
Materials and Methods page
3T8G
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.7 α = 90
    b = 92.7 β = 90
    c = 130.8 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating Mirror
    Collection Date 2009-08-14
     
    Diffraction Radiation
    Monochromator Bartels
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.5
    Resolution(Low) 50
    Number Reflections(All) 53702
    Number Reflections(Observed) 53702
    Percent Possible(Observed) 99.9
    Redundancy 20.7
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.53
    Percent Possible(All) 99.5
    Mean I Over Sigma(Observed) 6.6
    R-Sym I(Observed) 0.499
    Redundancy 18.5
    Number Unique Reflections(All) 2620
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 40.14
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 54982
    Number of Reflections(Observed) 52333
    Number of Reflections(R-Free) 2649
    Percent Reflections(Observed) 97.59
    R-Factor(All) 0.1423
    R-Factor(Observed) 0.1423
    R-Work 0.1416
    R-Free 0.1562
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.4543
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.4543
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.9086
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.5273
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2444
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.207
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5273
    Shell Resolution(Low) 1.5567
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2468
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5567
    Shell Resolution(Low) 1.5885
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2468
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5885
    Shell Resolution(Low) 1.623
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.1428
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.623
    Shell Resolution(Low) 1.6607
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2535
    R-Factor(R-Work) 0.1408
    R-Factor(R-Free) 0.1766
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6607
    Shell Resolution(Low) 1.7023
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.1395
    R-Factor(R-Free) 0.1543
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7023
    Shell Resolution(Low) 1.7483
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1826
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7483
    Shell Resolution(Low) 1.7998
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7998
    Shell Resolution(Low) 1.8578
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.13
    R-Factor(R-Free) 0.1526
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8578
    Shell Resolution(Low) 1.9242
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.1312
    R-Factor(R-Free) 0.1647
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9242
    Shell Resolution(Low) 2.0013
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1387
    R-Factor(R-Free) 0.146
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0013
    Shell Resolution(Low) 2.0924
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0924
    Shell Resolution(Low) 2.2027
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.137
    R-Factor(R-Free) 0.1642
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2027
    Shell Resolution(Low) 2.3407
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.137
    R-Factor(R-Free) 0.1423
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3407
    Shell Resolution(Low) 2.5214
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.1495
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5214
    Shell Resolution(Low) 2.775
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1623
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.775
    Shell Resolution(Low) 3.1764
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.1402
    R-Factor(R-Free) 0.1328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1764
    Shell Resolution(Low) 4.0014
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1344
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0014
    Shell Resolution(Low) 40.1546
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2951
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1426
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 15.241
    f_angle_d 1.054
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2428
    Nucleic Acid Atoms 0
    Heterogen Atoms 77
    Solvent Atoms 442
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb