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X-RAY DIFFRACTION
Materials and Methods page
3T8F
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.4 α = 90
    b = 92.4 β = 90
    c = 131.2 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-12-14
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.44
    Resolution(Low) 50
    Number Reflections(All) 60157
    Number Reflections(Observed) 60157
    Percent Possible(Observed) 99.7
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 1.44
    Resolution(Low) 1.46
    Percent Possible(All) 96.2
    Mean I Over Sigma(Observed) 5.4
    R-Sym I(Observed) 0.272
    Redundancy 4.3
    Number Unique Reflections(All) 2836
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.44
    Resolution(Low) 30.349
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 61525
    Number of Reflections(Observed) 58574
    Number of Reflections(R-Free) 2951
    Percent Reflections(Observed) 97.18
    R-Factor(All) 0.1429
    R-Factor(Observed) 0.1429
    R-Work 0.1421
    R-Free 0.1586
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.2906
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.2906
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.5811
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.44
    Shell Resolution(Low) 1.4636
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2488
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1758
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4636
    Shell Resolution(Low) 1.4888
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.2184
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4888
    Shell Resolution(Low) 1.5159
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5159
    Shell Resolution(Low) 1.5451
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.1477
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5451
    Shell Resolution(Low) 1.5766
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2529
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1496
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5766
    Shell Resolution(Low) 1.6109
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1923
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6109
    Shell Resolution(Low) 1.6484
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.142
    R-Factor(R-Free) 0.1594
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6484
    Shell Resolution(Low) 1.6896
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1364
    R-Factor(R-Free) 0.1657
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6896
    Shell Resolution(Low) 1.7353
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1393
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7353
    Shell Resolution(Low) 1.7863
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1366
    R-Factor(R-Free) 0.1795
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7863
    Shell Resolution(Low) 1.844
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.1335
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.844
    Shell Resolution(Low) 1.9099
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1478
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9099
    Shell Resolution(Low) 1.9863
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1368
    R-Factor(R-Free) 0.1561
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9863
    Shell Resolution(Low) 2.0767
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0767
    Shell Resolution(Low) 2.1862
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1378
    R-Factor(R-Free) 0.1706
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1862
    Shell Resolution(Low) 2.3231
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1519
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3231
    Shell Resolution(Low) 2.5024
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.1494
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5024
    Shell Resolution(Low) 2.754
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1573
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.754
    Shell Resolution(Low) 3.1522
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.1406
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1522
    Shell Resolution(Low) 3.97
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1351
    R-Factor(R-Free) 0.13
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.97
    Shell Resolution(Low) 30.3561
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2942
    R-Factor(R-Work) 0.1517
    R-Factor(R-Free) 0.1755
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 15.128
    f_angle_d 1.048
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2432
    Nucleic Acid Atoms 0
    Heterogen Atoms 75
    Solvent Atoms 477
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb