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X-RAY DIFFRACTION
Materials and Methods page
3T8D
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.8 α = 90
    b = 92.8 β = 90
    c = 130.1 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-10-20
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.41
    Resolution(Low) 50
    Number Reflections(All) 64097
    Number Reflections(Observed) 64097
    Percent Possible(Observed) 99.8
    Redundancy 4.7
     
    High Resolution Shell Details
    Resolution(High) 1.41
    Resolution(Low) 1.43
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.494
    Redundancy 4.6
    Number Unique Reflections(All) 3131
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.41
    Resolution(Low) 31.683
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 63974
    Number of Reflections(Observed) 60892
    Number of Reflections(R-Free) 3082
    Percent Reflections(Observed) 94.96
    R-Factor(All) 0.1277
    R-Factor(Observed) 0.1277
    R-Work 0.1263
    R-Free 0.1531
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0575
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.0575
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.115
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.41
    Shell Resolution(Low) 1.432
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2332
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.432
    Shell Resolution(Low) 1.4555
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2433
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.2116
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4555
    Shell Resolution(Low) 1.4806
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2424
    R-Factor(R-Work) 0.152
    R-Factor(R-Free) 0.2063
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4806
    Shell Resolution(Low) 1.5075
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2438
    R-Factor(R-Work) 0.1528
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5075
    Shell Resolution(Low) 1.5365
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2469
    R-Factor(R-Work) 0.1364
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5365
    Shell Resolution(Low) 1.5679
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.1235
    R-Factor(R-Free) 0.1743
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5679
    Shell Resolution(Low) 1.602
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2528
    R-Factor(R-Work) 0.1137
    R-Factor(R-Free) 0.1616
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.602
    Shell Resolution(Low) 1.6392
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.1109
    R-Factor(R-Free) 0.1621
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6392
    Shell Resolution(Low) 1.6802
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1114
    R-Factor(R-Free) 0.1622
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6802
    Shell Resolution(Low) 1.7257
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.1089
    R-Factor(R-Free) 0.1729
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7257
    Shell Resolution(Low) 1.7764
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1028
    R-Factor(R-Free) 0.1514
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7764
    Shell Resolution(Low) 1.8338
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.098
    R-Factor(R-Free) 0.1657
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8338
    Shell Resolution(Low) 1.8993
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.1065
    R-Factor(R-Free) 0.1324
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8993
    Shell Resolution(Low) 1.9753
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.113
    R-Factor(R-Free) 0.1492
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9753
    Shell Resolution(Low) 2.0652
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1188
    R-Factor(R-Free) 0.1556
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0652
    Shell Resolution(Low) 2.1741
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1113
    R-Factor(R-Free) 0.1351
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1741
    Shell Resolution(Low) 2.3103
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1092
    R-Factor(R-Free) 0.1301
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3103
    Shell Resolution(Low) 2.4886
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2737
    R-Factor(R-Work) 0.1189
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4886
    Shell Resolution(Low) 2.7389
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2772
    R-Factor(R-Work) 0.1297
    R-Factor(R-Free) 0.151
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7389
    Shell Resolution(Low) 3.1349
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2812
    R-Factor(R-Work) 0.1319
    R-Factor(R-Free) 0.1402
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1349
    Shell Resolution(Low) 3.9485
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2846
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.13
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9485
    Shell Resolution(Low) 31.691
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3016
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.1511
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 12.935
    f_angle_d 1.05
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2428
    Nucleic Acid Atoms 0
    Heterogen Atoms 71
    Solvent Atoms 450
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb