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X-RAY DIFFRACTION
Materials and Methods page
3T8C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.6 α = 90
    b = 92.6 β = 90
    c = 130.4 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.66
    Resolution(Low) 50
    Number Reflections(All) 39580
    Number Reflections(Observed) 39580
    Percent Possible(Observed) 99.7
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 1.66
    Resolution(Low) 1.69
    Percent Possible(All) 99.7
    Mean I Over Sigma(Observed) 7.6
    R-Sym I(Observed) 0.22
    Redundancy 5.4
    Number Unique Reflections(All) 1938
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.66
    Resolution(Low) 43.631
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 40654
    Number of Reflections(Observed) 38705
    Number of Reflections(R-Free) 1949
    Percent Reflections(Observed) 97.64
    R-Factor(All) 0.1405
    R-Factor(Observed) 0.1405
    R-Work 0.1391
    R-Free 0.1658
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.2182
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.2182
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.4365
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6601
    Shell Resolution(Low) 1.7016
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2467
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.2109
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7016
    Shell Resolution(Low) 1.7476
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2519
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7476
    Shell Resolution(Low) 1.799
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.1431
    R-Factor(R-Free) 0.1798
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.799
    Shell Resolution(Low) 1.8571
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2534
    R-Factor(R-Work) 0.1327
    R-Factor(R-Free) 0.1919
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8571
    Shell Resolution(Low) 1.9235
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.1332
    R-Factor(R-Free) 0.1874
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9235
    Shell Resolution(Low) 2.0005
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.1299
    R-Factor(R-Free) 0.1903
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0005
    Shell Resolution(Low) 2.0915
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1304
    R-Factor(R-Free) 0.1473
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0915
    Shell Resolution(Low) 2.2018
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1243
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2018
    Shell Resolution(Low) 2.3397
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1289
    R-Factor(R-Free) 0.1412
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3397
    Shell Resolution(Low) 2.5204
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1333
    R-Factor(R-Free) 0.1568
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5204
    Shell Resolution(Low) 2.774
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.1754
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.774
    Shell Resolution(Low) 3.1753
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1343
    R-Factor(R-Free) 0.1429
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1753
    Shell Resolution(Low) 4.0001
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.1377
    R-Factor(R-Free) 0.1511
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0001
    Shell Resolution(Low) 43.6464
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2874
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.1714
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.074
    f_dihedral_angle_d 13.124
    f_angle_d 1.03
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2428
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 432
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb