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X-RAY DIFFRACTION
Materials and Methods page
3T87
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.7 α = 90
    b = 92.7 β = 90
    c = 131.1 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating mirror
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.28
    Resolution(Low) 50
    Number Reflections(All) 83248
    Number Reflections(Observed) 83248
    Percent Possible(Observed) 97.0
    Redundancy 10.7
     
    High Resolution Shell Details
    Resolution(High) 1.28
    Resolution(Low) 1.3
    Percent Possible(All) 99.1
    Mean I Over Sigma(Observed) 5.2
    R-Sym I(Observed) 0.378
    Redundancy 9.0
    Number Unique Reflections(All) 4180
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.28
    Resolution(Low) 34.232
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 84816
    Number of Reflections(Observed) 80710
    Number of Reflections(R-Free) 4106
    Percent Reflections(Observed) 94.12
    R-Factor(All) 0.1065
    R-Factor(Observed) 0.1065
    R-Work 0.1054
    R-Free 0.127
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.1894
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1894
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.3787
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2801
    Shell Resolution(Low) 1.2951
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.1412
    R-Factor(R-Free) 0.1603
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2951
    Shell Resolution(Low) 1.3109
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.1334
    R-Factor(R-Free) 0.1701
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3109
    Shell Resolution(Low) 1.3275
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1237
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3275
    Shell Resolution(Low) 1.345
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2495
    R-Factor(R-Work) 0.1218
    R-Factor(R-Free) 0.1434
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.345
    Shell Resolution(Low) 1.3634
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3634
    Shell Resolution(Low) 1.3829
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.1017
    R-Factor(R-Free) 0.1461
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3829
    Shell Resolution(Low) 1.4035
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.1043
    R-Factor(R-Free) 0.1376
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4035
    Shell Resolution(Low) 1.4254
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.0947
    R-Factor(R-Free) 0.1063
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4254
    Shell Resolution(Low) 1.4488
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.0934
    R-Factor(R-Free) 0.1208
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4488
    Shell Resolution(Low) 1.4738
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.0934
    R-Factor(R-Free) 0.1211
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4738
    Shell Resolution(Low) 1.5006
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.0893
    R-Factor(R-Free) 0.1112
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5006
    Shell Resolution(Low) 1.5295
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.0854
    R-Factor(R-Free) 0.1218
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5295
    Shell Resolution(Low) 1.5607
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.0861
    R-Factor(R-Free) 0.1231
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5607
    Shell Resolution(Low) 1.5946
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.0815
    R-Factor(R-Free) 0.1077
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5946
    Shell Resolution(Low) 1.6317
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.0785
    R-Factor(R-Free) 0.1076
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6317
    Shell Resolution(Low) 1.6725
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.0792
    R-Factor(R-Free) 0.101
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6725
    Shell Resolution(Low) 1.7177
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.0778
    R-Factor(R-Free) 0.0965
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7177
    Shell Resolution(Low) 1.7683
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.0832
    R-Factor(R-Free) 0.1086
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7683
    Shell Resolution(Low) 1.8253
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.0829
    R-Factor(R-Free) 0.1083
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8253
    Shell Resolution(Low) 1.8906
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.0818
    R-Factor(R-Free) 0.113
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8906
    Shell Resolution(Low) 1.9663
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.0891
    R-Factor(R-Free) 0.0917
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9663
    Shell Resolution(Low) 2.0558
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.0922
    R-Factor(R-Free) 0.1124
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0558
    Shell Resolution(Low) 2.1641
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.093
    R-Factor(R-Free) 0.1208
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1641
    Shell Resolution(Low) 2.2997
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.0955
    R-Factor(R-Free) 0.1247
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2997
    Shell Resolution(Low) 2.4772
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1043
    R-Factor(R-Free) 0.1131
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4772
    Shell Resolution(Low) 2.7264
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1115
    R-Factor(R-Free) 0.139
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7264
    Shell Resolution(Low) 3.1207
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.1157
    R-Factor(R-Free) 0.1384
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1207
    Shell Resolution(Low) 3.9308
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1258
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9308
    Shell Resolution(Low) 34.2441
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.141
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.088
    f_dihedral_angle_d 13.51
    f_angle_d 1.353
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2432
    Nucleic Acid Atoms 0
    Heterogen Atoms 73
    Solvent Atoms 481
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb