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X-RAY DIFFRACTION
Materials and Methods page
3T74
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.6 α = 90
    b = 92.6 β = 90
    c = 131 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator Double Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 0.91841
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.28
    Resolution(Low) 50
    Number Reflections(All) 83375
    Number Reflections(Observed) 83375
    Percent Possible(Observed) 97.3
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 1.28
    Resolution(Low) 1.3
    Percent Possible(All) 95.4
    Mean I Over Sigma(Observed) 5.3
    R-Sym I(Observed) 0.326
    Redundancy 5.7
    Number Unique Reflections(All) 4026
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.28
    Resolution(Low) 22.797
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 85060
    Number of Reflections(Observed) 80965
    Number of Reflections(R-Free) 4095
    Percent Reflections(Observed) 94.71
    R-Factor(All) 0.1065
    R-Factor(Observed) 0.1065
    R-Work 0.1055
    R-Free 0.1271
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.4496
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -2.4496
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.8992
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.28
    Shell Resolution(Low) 1.2951
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2427
    R-Factor(R-Work) 0.1402
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2951
    Shell Resolution(Low) 1.3108
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2436
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3108
    Shell Resolution(Low) 1.3274
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2480
    R-Factor(R-Work) 0.1207
    R-Factor(R-Free) 0.1469
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3274
    Shell Resolution(Low) 1.3449
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2490
    R-Factor(R-Work) 0.1144
    R-Factor(R-Free) 0.13
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3449
    Shell Resolution(Low) 1.3633
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.1069
    R-Factor(R-Free) 0.1267
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3633
    Shell Resolution(Low) 1.3828
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2533
    R-Factor(R-Work) 0.0945
    R-Factor(R-Free) 0.1243
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3828
    Shell Resolution(Low) 1.4034
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.1016
    R-Factor(R-Free) 0.1239
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4034
    Shell Resolution(Low) 1.4254
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.0944
    R-Factor(R-Free) 0.1405
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4254
    Shell Resolution(Low) 1.4487
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.0898
    R-Factor(R-Free) 0.1364
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4487
    Shell Resolution(Low) 1.4737
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2550
    R-Factor(R-Work) 0.0878
    R-Factor(R-Free) 0.1014
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4737
    Shell Resolution(Low) 1.5005
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.084
    R-Factor(R-Free) 0.128
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5005
    Shell Resolution(Low) 1.5294
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.0853
    R-Factor(R-Free) 0.1232
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5294
    Shell Resolution(Low) 1.5606
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.0785
    R-Factor(R-Free) 0.1205
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5606
    Shell Resolution(Low) 1.5945
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.0775
    R-Factor(R-Free) 0.1128
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5945
    Shell Resolution(Low) 1.6316
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.0785
    R-Factor(R-Free) 0.1042
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6316
    Shell Resolution(Low) 1.6724
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.0826
    R-Factor(R-Free) 0.1167
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6724
    Shell Resolution(Low) 1.7176
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.0865
    R-Factor(R-Free) 0.1183
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7176
    Shell Resolution(Low) 1.7681
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.085
    R-Factor(R-Free) 0.1099
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7681
    Shell Resolution(Low) 1.8251
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.0822
    R-Factor(R-Free) 0.1181
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8251
    Shell Resolution(Low) 1.8903
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.0863
    R-Factor(R-Free) 0.0964
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8903
    Shell Resolution(Low) 1.966
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.0896
    R-Factor(R-Free) 0.1127
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.966
    Shell Resolution(Low) 2.0554
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.0952
    R-Factor(R-Free) 0.1146
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0554
    Shell Resolution(Low) 2.1637
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.0915
    R-Factor(R-Free) 0.1067
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1637
    Shell Resolution(Low) 2.2991
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.0974
    R-Factor(R-Free) 0.1164
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2991
    Shell Resolution(Low) 2.4764
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1088
    R-Factor(R-Free) 0.1333
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4764
    Shell Resolution(Low) 2.7253
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2842
    R-Factor(R-Work) 0.1152
    R-Factor(R-Free) 0.1543
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7253
    Shell Resolution(Low) 3.1188
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2835
    R-Factor(R-Work) 0.1143
    R-Factor(R-Free) 0.1284
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1188
    Shell Resolution(Low) 3.9261
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2918
    R-Factor(R-Work) 0.1218
    R-Factor(R-Free) 0.1394
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9261
    Shell Resolution(Low) 22.8004
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3058
    R-Factor(R-Work) 0.1469
    R-Factor(R-Free) 0.1447
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.084
    f_dihedral_angle_d 15.328
    f_angle_d 1.318
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2432
    Nucleic Acid Atoms 0
    Heterogen Atoms 74
    Solvent Atoms 499
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb