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X-RAY DIFFRACTION
Materials and Methods page
3T73
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 50 mM Tris, 1.9 M cesium chloride, 50% DMSO, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.7 α = 90
    b = 92.7 β = 90
    c = 130.1 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 108
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Collimating mirror
    Collection Date 2009-08-14
     
    Diffraction Radiation
    Monochromator Bartels
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.00
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.6
    Resolution(Low) 50
    Number Reflections(All) 44226
    Number Reflections(Observed) 44226
    Percent Possible(Observed) 100.0
    Redundancy 16.3
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.63
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 6.5
    R-Sym I(Observed) 0.495
    Redundancy 15.1
    Number Unique Reflections(All) 2164
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 43.662
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 44799
    Number of Reflections(Observed) 42664
    Number of Reflections(R-Free) 2135
    Percent Reflections(Observed) 96.65
    R-Factor(All) 0.1439
    R-Factor(Observed) 0.1439
    R-Work 0.1428
    R-Free 0.1657
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.8873
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.8873
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.7746
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.6373
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2469
    R-Factor(R-Work) 0.1731
    R-Factor(R-Free) 0.1906
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6373
    Shell Resolution(Low) 1.6782
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6782
    Shell Resolution(Low) 1.7236
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7236
    Shell Resolution(Low) 1.7743
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1464
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7743
    Shell Resolution(Low) 1.8316
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8316
    Shell Resolution(Low) 1.897
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.13
    R-Factor(R-Free) 0.1707
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.897
    Shell Resolution(Low) 1.973
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1304
    R-Factor(R-Free) 0.1742
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.973
    Shell Resolution(Low) 2.0628
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1346
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0628
    Shell Resolution(Low) 2.1715
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1329
    R-Factor(R-Free) 0.1597
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1715
    Shell Resolution(Low) 2.3076
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1383
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3076
    Shell Resolution(Low) 2.4857
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2747
    R-Factor(R-Work) 0.1371
    R-Factor(R-Free) 0.1651
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4857
    Shell Resolution(Low) 2.7359
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2771
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.156
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7359
    Shell Resolution(Low) 3.1316
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2820
    R-Factor(R-Work) 0.1422
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1316
    Shell Resolution(Low) 3.9451
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2869
    R-Factor(R-Work) 0.1397
    R-Factor(R-Free) 0.1459
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9451
    Shell Resolution(Low) 43.6781
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3058
    R-Factor(R-Work) 0.1533
    R-Factor(R-Free) 0.1648
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 14.803
    f_angle_d 1.055
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2428
    Nucleic Acid Atoms 0
    Heterogen Atoms 70
    Solvent Atoms 400
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection MAR345dtb