X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 10
Temperature 297.0
Details 0.2 M sodium/potassium tartrate, 20% w/v PEG3350, pH 10.0, VAPOR DIFFUSION, SITTING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 157.05 α = 90
b = 157.05 β = 90
c = 157.05 γ = 90
Symmetry
Space Group I 4 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 105
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2010-07-28
Diffraction Radiation
Monochromator Protocol
Si(111) Rosenbaum-Rock double-crystal monochromator: LN2-cooled, sagitally focusing 2nd crystal, Rosenbaum-Rock vertical focusing mirror SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.2830 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 49.66 100.0 0.102 -- -- 7.7 14068 14067 1.0 4.7 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.35 2.43 100.0 0.462 -- 4.7 7.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.353 24.832 -- 1.28 14068 14067 1250 99.96 0.1673 0.165 0.165 0.211 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3532 2.4474 -- 136 2780 0.2076 0.2698 -- 100.0
X Ray Diffraction 2.4474 2.5586 -- 142 2731 0.1933 0.2787 -- 100.0
X Ray Diffraction 2.5586 2.6934 -- 135 2726 0.1857 0.2361 -- 100.0
X Ray Diffraction 2.6934 2.8619 -- 129 2768 0.1774 0.3004 -- 100.0
X Ray Diffraction 2.8619 3.0825 -- 140 2755 0.1727 0.2103 -- 100.0
X Ray Diffraction 3.0825 3.392 -- 119 2757 0.1569 0.2365 -- 100.0
X Ray Diffraction 3.392 3.8812 -- 154 2732 0.1551 0.1869 -- 100.0
X Ray Diffraction 3.8812 4.8838 -- 160 2713 0.1308 0.158 -- 100.0
X Ray Diffraction 4.8838 24.8332 -- 135 2780 0.1773 0.2073 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.0
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.0
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.065
f_dihedral_angle_d 17.047
f_angle_d 1.062
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1615
Nucleic Acid Atoms 264
Heterogen Atoms 32
Solvent Atoms 211

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SOLVE Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
SOLVE model building
HKL-2000 data collection