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X-RAY DIFFRACTION
Materials and Methods page
3SZQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 10
    Temperature 297.0
    Details 0.2 M sodium/potassium tartrate, 20% w/v PEG3350, pH 10.0, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 157.05 α = 90
    b = 157.05 β = 90
    c = 157.05 γ = 90
     
    Space Group
    Space Group Name:    I 4 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 105
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-07-28
     
    Diffraction Radiation
    Monochromator Si(111) Rosenbaum-Rock double-crystal monochromator: LN2-cooled, sagitally focusing 2nd crystal, Rosenbaum-Rock vertical focusing mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.2830
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 4.7
    Resolution(High) 2.35
    Resolution(Low) 49.66
    Number Reflections(All) 14068
    Number Reflections(Observed) 14067
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.102
    Redundancy 7.7
     
    High Resolution Shell Details
    Resolution(High) 2.35
    Resolution(Low) 2.43
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.462
    Mean I Over Sigma(Observed) 4.7
    Redundancy 7.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.353
    Resolution(Low) 24.832
    Cut-off Sigma(F) 1.28
    Number of Reflections(all) 14068
    Number of Reflections(Observed) 14067
    Number of Reflections(R-Free) 1250
    Percent Reflections(Observed) 99.96
    R-Factor(All) 0.1673
    R-Factor(Observed) 0.165
    R-Work 0.165
    R-Free 0.211
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3532
    Shell Resolution(Low) 2.4474
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4474
    Shell Resolution(Low) 2.5586
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5586
    Shell Resolution(Low) 2.6934
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2726
    R-Factor(R-Work) 0.1857
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6934
    Shell Resolution(Low) 2.8619
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2768
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.3004
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8619
    Shell Resolution(Low) 3.0825
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0825
    Shell Resolution(Low) 3.392
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.2365
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.392
    Shell Resolution(Low) 3.8812
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.1869
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8812
    Shell Resolution(Low) 4.8838
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1308
    R-Factor(R-Free) 0.158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8838
    Shell Resolution(Low) 24.8332
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.065
    f_dihedral_angle_d 17.047
    f_angle_d 1.062
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1615
    Nucleic Acid Atoms 264
    Heterogen Atoms 32
    Solvent Atoms 211
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building SOLVE
    data collection HKL-2000