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X-RAY DIFFRACTION
Materials and Methods page
3SZ6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 3.5
    Temperature 298.0
    Details 2 M NaCl, 0.1 M citric acid (pH 3.5) , VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.64 α = 99.24
    b = 43.66 β = 96.53
    c = 47.41 γ = 107.35
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Collection Date 2008-06-18
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97929
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.8
    Resolution(Low) 46.1
    Number Reflections(All) 25248
    Number Reflections(Observed) 24541
    Percent Possible(Observed) 97.2
     
    High Resolution Shell Details
    Resolution(High) 1.8
    Resolution(Low) 1.86
    Percent Possible(All) 94.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.8
    Resolution(Low) 25.574
    Cut-off Sigma(F) 0.06
    Number of Reflections(Observed) 22863
    Number of Reflections(R-Free) 2314
    Percent Reflections(Observed) 90.47
    R-Factor(Observed) 0.2113
    R-Work 0.2087
    R-Free 0.2342
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 6.3499
    Anisotropic B[1][2] 1.8666
    Anisotropic B[1][3] -3.0107
    Anisotropic B[2][2] 1.2253
    Anisotropic B[2][3] -6.4771
    Anisotropic B[3][3] -7.5752
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8004
    Shell Resolution(Low) 1.8372
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 894
    R-Factor(R-Work) 0.2845
    R-Factor(R-Free) 0.3512
    Percent Reflections(Observed) 65.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8372
    Shell Resolution(Low) 1.8771
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 921
    R-Factor(R-Work) 0.2857
    R-Factor(R-Free) 0.3767
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8771
    Shell Resolution(Low) 1.9208
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 1033
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.3176
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9208
    Shell Resolution(Low) 1.9688
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1113
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2895
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9688
    Shell Resolution(Low) 2.022
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1169
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.2584
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.022
    Shell Resolution(Low) 2.0815
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1256
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0815
    Shell Resolution(Low) 2.1486
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1270
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2687
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1486
    Shell Resolution(Low) 2.2254
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.2052
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2254
    Shell Resolution(Low) 2.3144
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1259
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2573
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3144
    Shell Resolution(Low) 2.4197
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1272
    R-Factor(R-Work) 0.2223
    R-Factor(R-Free) 0.2529
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4197
    Shell Resolution(Low) 2.5471
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1252
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5471
    Shell Resolution(Low) 2.7066
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1294
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7066
    Shell Resolution(Low) 2.9153
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.2375
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9153
    Shell Resolution(Low) 3.2081
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1291
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2244
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2081
    Shell Resolution(Low) 3.6712
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1340
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6712
    Shell Resolution(Low) 4.6209
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1315
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.1821
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6209
    Shell Resolution(Low) 25.5768
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1309
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2249
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.038
    f_dihedral_angle_d 8.939
    f_angle_d 0.566
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1880
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 161
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building Phaser
    data collection ADSC version: Quantum