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X-RAY DIFFRACTION
Materials and Methods page
3SY7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 5.5
    Temperature 295.0
    Details 2 M ammonium sulphate 50 mM Na-citrate, pH 5.5, VAPOR DIFFUSION, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 136.41 α = 90
    b = 103.89 β = 107.68
    c = 47.54 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-12-02
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.10
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.7
    Resolution(High) 2.15
    Resolution(Low) 50
    Number Reflections(All) 34239
    Number Reflections(Observed) 33554
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 80.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 19.993
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 34239
    Number of Reflections(Observed) 33514
    Number of Reflections(R-Free) 2001
    Percent Reflections(Observed) 97.55
    R-Factor(Observed) 0.1974
    R-Work 0.1956
    R-Free 0.2259
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.3124
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.9502
    Anisotropic B[2][2] -10.145
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 5.8326
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1488
    Shell Resolution(Low) 2.2024
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 1768
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.3244
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2024
    Shell Resolution(Low) 2.2619
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2092
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.2987
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2619
    Shell Resolution(Low) 2.3284
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2260
    R-Factor(R-Work) 0.2493
    R-Factor(R-Free) 0.3447
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3284
    Shell Resolution(Low) 2.4034
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2280
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2402
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4034
    Shell Resolution(Low) 2.4891
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2325
    R-Factor(R-Work) 0.1966
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4891
    Shell Resolution(Low) 2.5886
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2286
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2171
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5886
    Shell Resolution(Low) 2.7061
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2310
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7061
    Shell Resolution(Low) 2.8484
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2300
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8484
    Shell Resolution(Low) 3.0263
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2302
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0263
    Shell Resolution(Low) 3.2591
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2308
    R-Factor(R-Work) 0.1746
    R-Factor(R-Free) 0.205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2591
    Shell Resolution(Low) 3.5853
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2315
    R-Factor(R-Work) 0.1831
    R-Factor(R-Free) 0.2136
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5853
    Shell Resolution(Low) 4.1003
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2305
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2072
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1003
    Shell Resolution(Low) 5.1512
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2321
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.1986
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1512
    Shell Resolution(Low) 19.9934
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2341
    R-Factor(R-Work) 0.2417
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.079
    f_dihedral_angle_d 19.873
    f_angle_d 1.072
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2969
    Nucleic Acid Atoms 0
    Heterogen Atoms 78
    Solvent Atoms 130
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building Phaser
    data collection CBASS