X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 5.5
Temperature 295.0
Details 2 M ammonium sulphate 50 mM Na-citrate, pH 5.5, VAPOR DIFFUSION, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 136.41 α = 90
b = 103.89 β = 107.68
c = 47.54 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2010-12-02
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 1.10 NSLS X25

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.15 50 98.0 -- -- -- -- 34239 33554 0.0 2.7 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.15 2.19 80.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.15 19.993 -- 1.34 34239 33514 2001 97.55 -- 0.1974 0.1956 0.2259 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1488 2.2024 -- 114 1768 0.2469 0.3244 -- 77.0
X Ray Diffraction 2.2024 2.2619 -- 138 2092 0.2469 0.2987 -- 91.0
X Ray Diffraction 2.2619 2.3284 -- 126 2260 0.2493 0.3447 -- 98.0
X Ray Diffraction 2.3284 2.4034 -- 151 2280 0.2114 0.2402 -- 100.0
X Ray Diffraction 2.4034 2.4891 -- 143 2325 0.1966 0.2542 -- 100.0
X Ray Diffraction 2.4891 2.5886 -- 156 2286 0.1835 0.2171 -- 100.0
X Ray Diffraction 2.5886 2.7061 -- 146 2310 0.1683 0.2129 -- 100.0
X Ray Diffraction 2.7061 2.8484 -- 142 2300 0.1829 0.2355 -- 100.0
X Ray Diffraction 2.8484 3.0263 -- 152 2302 0.1817 0.2399 -- 100.0
X Ray Diffraction 3.0263 3.2591 -- 147 2308 0.1746 0.205 -- 100.0
X Ray Diffraction 3.2591 3.5853 -- 146 2315 0.1831 0.2136 -- 100.0
X Ray Diffraction 3.5853 4.1003 -- 149 2305 0.1871 0.2072 -- 100.0
X Ray Diffraction 4.1003 5.1512 -- 149 2321 0.1764 0.1986 -- 100.0
X Ray Diffraction 5.1512 19.9934 -- 142 2341 0.2417 0.2405 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 4.3124
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -0.9502
Anisotropic B[2][2] -10.145
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 5.8326
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.079
f_dihedral_angle_d 19.873
f_angle_d 1.072
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2969
Nucleic Acid Atoms 0
Heterogen Atoms 78
Solvent Atoms 130

Software

Computing
Computing Package Purpose
CBASS Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
Phaser model building
CBASS data collection