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X-RAY DIFFRACTION
Materials and Methods page
3SVL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 273.0
    Details 10% PEG8000, 0.150M NaCl, 0.1M Ca Acetate, 0.1M BisTris, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 273K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 107.25 α = 90
    b = 107.25 β = 90
    c = 128.25 γ = 120
     
    Space Group
    Space Group Name:    P 63 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2008-04-30
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X12C
    Wavelength List 1.0166
    Site NSLS
    Beamline X12C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 22919
    Number Reflections(Observed) 22919
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.155
    B(Isotropic) From Wilson Plot 10.5
    Redundancy 24.5
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.498
    Redundancy 21.6
    Number Unique Reflections(All) 2234
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 38.83
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 20771
    Number of Reflections(Observed) 20771
    Number of Reflections(R-Free) 807
    Percent Reflections(Observed) 91.3
    R-Factor(All) 0.257
    R-Factor(Observed) 0.257
    R-Work 0.237
    R-Free 0.2704
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.9
    Anisotropic B[1][1] -0.47
    Anisotropic B[1][2] 1.52
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.47
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.94
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.34
    Number of Reflections(Observed) 2443
    Number of Reflections(R-Free) 82
    R-Factor(R-Work) 0.422
    R-Factor(R-Free) 0.422
    R-Free Error 0.047
    Percent Reflections(Observed) 66.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_improper_angle_deg 1.02
    c_dihedral_angle_deg 22.2
    c_angle_deg 1.3
    c_bond_d 0.007
     
    Coordinate Error
    Luzzati ESD(Observed) 0.3
    Luzzati Sigma A(Observed) 0.32
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.36
    Luzzati Sigma A(R-Free Set) 0.31
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2743
    Nucleic Acid Atoms 0
    Heterogen Atoms 63
    Solvent Atoms 87
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution MOLREP
    Structure Refinement CNS 1.1
     
    Software
    refinement CNS version: 1.1
    model building MOLREP
    data collection CBASS