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X-RAY DIFFRACTION
Materials and Methods page
3SRX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 289.0
    Details 0.2 M Potassium thiocyanate, 20 % w/v Polyethylene glycol 3,350, 10 mM Cadmium Chloride, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 108.94 α = 90
    b = 108.94 β = 90
    c = 237.88 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-06-09
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97935
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 50
    Number Reflections(All) 28517
    Number Reflections(Observed) 28517
    Percent Possible(Observed) 95.7
    B(Isotropic) From Wilson Plot 44.27
    Redundancy 5.6
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 88.4
    Mean I Over Sigma(Observed) 1.8
    R-Sym I(Observed) 0.741
    Redundancy 4.1
    Number Unique Reflections(All) 1292
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.5
    Resolution(Low) 49.526
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 26525
    Number of Reflections(Observed) 26525
    Number of Reflections(R-Free) 1999
    Percent Reflections(Observed) 89.21
    R-Factor(All) 0.178
    R-Factor(Observed) 0.178
    R-Work 0.175
    R-Free 0.212
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 68.4
    Anisotropic B[1][1] 8.0501
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 8.0501
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -16.1003
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5001
    Shell Resolution(Low) 2.5626
    Number of Reflections(Observed) 1522
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 1407
    R-Factor(R-Work) 0.2784
    R-Factor(R-Free) 0.3459
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5626
    Shell Resolution(Low) 2.6319
    Number of Reflections(Observed) 1654
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 1530
    R-Factor(R-Work) 0.2614
    R-Factor(R-Free) 0.2904
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6319
    Shell Resolution(Low) 2.7093
    Number of Reflections(Observed) 1729
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1598
    R-Factor(R-Work) 0.2436
    R-Factor(R-Free) 0.3004
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7093
    Shell Resolution(Low) 2.7968
    Number of Reflections(Observed) 1798
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1663
    R-Factor(R-Work) 0.2287
    R-Factor(R-Free) 0.2574
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7968
    Shell Resolution(Low) 2.8967
    Number of Reflections(Observed) 1840
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1701
    R-Factor(R-Work) 0.2152
    R-Factor(R-Free) 0.2834
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8967
    Shell Resolution(Low) 3.0127
    Number of Reflections(Observed) 1885
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1743
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0127
    Shell Resolution(Low) 3.1498
    Number of Reflections(Observed) 1919
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1774
    R-Factor(R-Work) 0.2132
    R-Factor(R-Free) 0.2463
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1498
    Shell Resolution(Low) 3.3158
    Number of Reflections(Observed) 1977
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1827
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3158
    Shell Resolution(Low) 3.5235
    Number of Reflections(Observed) 1975
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1828
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5235
    Shell Resolution(Low) 3.7955
    Number of Reflections(Observed) 2000
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1849
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7955
    Shell Resolution(Low) 4.1773
    Number of Reflections(Observed) 2013
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1862
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1773
    Shell Resolution(Low) 4.7813
    Number of Reflections(Observed) 2022
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1869
    R-Factor(R-Work) 0.1253
    R-Factor(R-Free) 0.1522
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7813
    Shell Resolution(Low) 6.0222
    Number of Reflections(Observed) 2061
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1906
    R-Factor(R-Work) 0.1432
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0222
    Shell Resolution(Low) 49.5354
    Number of Reflections(Observed) 2130
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 1969
    R-Factor(R-Work) 0.161
    R-Factor(R-Free) 0.1768
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.11
    f_dihedral_angle_d 15.205
    f_angle_d 1.273
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3465
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 116
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution phenix, phaser
    Structure Refinement PHENIX (phenix.refine: dev_761)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_761)
    model building phaser
    model building phenix
    data collection HKL3000
    data collection SBCCOLLECT