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X-RAY DIFFRACTION
Materials and Methods page
3SR0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.4
    Temperature 298.0
    Details 0.1M Sodium Acetate trihydrate pH 5.4, 0.2M Ammonium Acetate, 30% w/v Polyethylene Glycol 4000, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.95 α = 90
    b = 69.58 β = 90
    c = 85.67 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-01-19
     
    Diffraction Radiation
    Monochromator KOHZU
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.1
    Wavelength List 0.97390
    Site ALS
    Beamline 8.2.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.57
    Resolution(Low) 41.79
    Number Reflections(All) 56246
    Number Reflections(Observed) 56098
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.085
    B(Isotropic) From Wilson Plot 15.4
    Redundancy 6.36
     
    High Resolution Shell Details
    Resolution(High) 1.565
    Resolution(Low) 1.61
    Percent Possible(All) 98.3
    R Merge I(Observed) 0.31
    Mean I Over Sigma(Observed) 3.7
    Redundancy 4.75
    Number Unique Reflections(All) 7959
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.565
    Resolution(Low) 41.786
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 56018
    Number of Reflections(Observed) 56016
    Number of Reflections(R-Free) 2844
    Percent Reflections(Observed) 99.57
    R-Factor(Observed) 0.1496
    R-Work 0.148
    R-Free 0.1885
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model anisotropic/isotropic
    Anisotropic B[1][1] 0.6227
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.4968
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.1195
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.565
    Shell Resolution(Low) 1.592
    Number of Reflections(Observed) 2530
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2530
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.592
    Shell Resolution(Low) 1.6209
    Number of Reflections(Observed) 2614
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.2292
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6209
    Shell Resolution(Low) 1.6521
    Number of Reflections(Observed) 2619
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2619
    R-Factor(R-Work) 0.1911
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6521
    Shell Resolution(Low) 1.6859
    Number of Reflections(Observed) 2601
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6859
    Shell Resolution(Low) 1.7225
    Number of Reflections(Observed) 2609
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1526
    R-Factor(R-Free) 0.2145
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7225
    Shell Resolution(Low) 1.7626
    Number of Reflections(Observed) 2634
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1361
    R-Factor(R-Free) 0.2019
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7626
    Shell Resolution(Low) 1.8067
    Number of Reflections(Observed) 2653
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1329
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8067
    Shell Resolution(Low) 1.8555
    Number of Reflections(Observed) 2641
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1284
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8555
    Shell Resolution(Low) 1.9101
    Number of Reflections(Observed) 2660
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1249
    R-Factor(R-Free) 0.1933
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9101
    Shell Resolution(Low) 1.9718
    Number of Reflections(Observed) 2658
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.1314
    R-Factor(R-Free) 0.2003
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9718
    Shell Resolution(Low) 2.0422
    Number of Reflections(Observed) 2664
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1362
    R-Factor(R-Free) 0.1966
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0422
    Shell Resolution(Low) 2.124
    Number of Reflections(Observed) 2648
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.124
    Shell Resolution(Low) 2.2207
    Number of Reflections(Observed) 2647
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1407
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2207
    Shell Resolution(Low) 2.3377
    Number of Reflections(Observed) 2652
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3377
    Shell Resolution(Low) 2.4842
    Number of Reflections(Observed) 2679
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1279
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4842
    Shell Resolution(Low) 2.6759
    Number of Reflections(Observed) 2694
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6759
    Shell Resolution(Low) 2.9452
    Number of Reflections(Observed) 2670
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1461
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9452
    Shell Resolution(Low) 3.3712
    Number of Reflections(Observed) 2733
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1487
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3712
    Shell Resolution(Low) 4.2467
    Number of Reflections(Observed) 2717
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.1671
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2467
    Shell Resolution(Low) 41.8006
    Number of Reflections(Observed) 2849
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2849
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.083
    f_dihedral_angle_d 16.452
    f_angle_d 1.515
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3236
    Nucleic Acid Atoms 0
    Heterogen Atoms 112
    Solvent Atoms 749
     
     
  •   Software and Computing Hide
    Computing
    Data Collection mosflm
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: dev_794)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_794)
    model building Phaser
    data collection mosflm