X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 9
Temperature 295.0
Details 0.1 M SPG buffer, 25% polyethylene glycol 1500, pH 9, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 64.98 α = 90
b = 64.98 β = 90
c = 74.21 γ = 90
Symmetry
Space Group P 43

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2011-05-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 1.00 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.15 50 -- -- -- -- 15.0 -- 16738 -- 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.149 2.23 100.0 0.331 -- 7.2 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.149 32.489 -- 1.35 -- 16711 842 99.06 -- 0.1984 0.1956 0.2345 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1513 2.2847 -- 155 2599 0.3215 0.3231 -- 94.0
X Ray Diffraction 2.2847 2.4588 -- 149 2633 0.3181 0.3419 -- 95.0
X Ray Diffraction 2.4588 2.702 -- 137 2630 0.3024 0.3368 -- 95.0
X Ray Diffraction 2.702 3.0834 -- 133 2640 0.265 0.2739 -- 95.0
X Ray Diffraction 3.0834 3.8493 -- 153 2605 0.1781 0.2442 -- 94.0
X Ray Diffraction 3.8493 10.1604 -- 115 2622 0.1234 0.1545 -- 93.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.6921
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.6921
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.3842
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.079
f_dihedral_angle_d 15.629
f_angle_d 1.292
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1954
Nucleic Acid Atoms 0
Heterogen Atoms 86
Solvent Atoms 87

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
HKL-2000 data collection