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X-RAY DIFFRACTION
Materials and Methods page
3SFJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 291.0
    Details 36% w/v PEG1000, 0.1 M ammonium thiocyanate, 0.1 M MES, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 26.97 α = 79.64
    b = 34.09 β = 87.15
    c = 66.86 γ = 89.97
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-08-19
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength 1.0000
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.99
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.24
    Resolution(Low) 65.69
    Number Reflections(All) 66313
    Number Reflections(Observed) 60547
    Percent Possible(Observed) 91.3
    R Merge I(Observed) 0.055
     
    High Resolution Shell Details
    Resolution(High) 1.24
    Resolution(Low) 1.3
    Percent Possible(All) 70.0
    R Merge I(Observed) 0.439
    Mean I Over Sigma(Observed) 4.29
    R-Sym I(Observed) 0.271
    Number Unique Reflections(All) 7064
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.24
    Resolution(Low) 19.108
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 66313
    Number of Reflections(Observed) 60547
    Number of Reflections(R-Free) 3044
    Percent Reflections(Observed) 91.32
    R-Factor(All) 0.1809
    R-Factor(Observed) 0.1809
    R-Work 0.1802
    R-Free 0.1929
    R-Free Selection Details IN THIN SHELLS
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.6002
    Anisotropic B[1][2] 0.4186
    Anisotropic B[1][3] -0.1652
    Anisotropic B[2][2] 8.891
    Anisotropic B[2][3] 1.7633
    Anisotropic B[3][3] -4.2908
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.24
    Shell Resolution(Low) 1.2594
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1546
    R-Factor(R-Work) 0.2718
    R-Factor(R-Free) 0.2569
    Percent Reflections(Observed) 55.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2594
    Shell Resolution(Low) 1.28
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 1959
    R-Factor(R-Work) 0.2492
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 67.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.28
    Shell Resolution(Low) 1.3021
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2259
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3021
    Shell Resolution(Low) 1.3257
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2349
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3257
    Shell Resolution(Low) 1.3512
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3512
    Shell Resolution(Low) 1.3788
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.205
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3788
    Shell Resolution(Low) 1.4088
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4088
    Shell Resolution(Low) 1.4415
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4415
    Shell Resolution(Low) 1.4776
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2099
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4776
    Shell Resolution(Low) 1.5175
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1879
    R-Factor(R-Free) 0.2118
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5175
    Shell Resolution(Low) 1.5621
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.2443
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5621
    Shell Resolution(Low) 1.6125
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1833
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6125
    Shell Resolution(Low) 1.6701
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.203
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6701
    Shell Resolution(Low) 1.737
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.737
    Shell Resolution(Low) 1.816
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.816
    Shell Resolution(Low) 1.9116
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9116
    Shell Resolution(Low) 2.0313
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.1922
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0313
    Shell Resolution(Low) 2.1879
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2790
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1879
    Shell Resolution(Low) 2.4077
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4077
    Shell Resolution(Low) 2.7552
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.1953
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7552
    Shell Resolution(Low) 3.4679
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4679
    Shell Resolution(Low) 19.1099
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.1558
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 13.365
    f_angle_d 1.011
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1775
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 256
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHENIX
    data collection HKL-2000