X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 9.9% PEG 4000, 9.0 % isopropanol, 100 mM Li2SO4, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.8 α = 90
b = 66.48 β = 90
c = 237.3 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2010-06-18
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 50 88.3 -- -- -- -- 67230 59364 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 23.734 -- 1.93 67229 59260 3002 88.31 -- 0.1922 0.19 0.2332 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9999 2.0326 -- 105 1758 0.2554 0.3047 -- 60.0
X Ray Diffraction 2.0326 2.0677 -- 119 1986 0.2399 0.3122 -- 66.0
X Ray Diffraction 2.0677 2.1052 -- 117 2119 0.2297 0.3262 -- 72.0
X Ray Diffraction 2.1052 2.1457 -- 108 2288 0.2183 0.2486 -- 76.0
X Ray Diffraction 2.1457 2.1895 -- 119 2407 0.2275 0.2791 -- 80.0
X Ray Diffraction 2.1895 2.237 -- 114 2505 0.2188 0.2843 -- 83.0
X Ray Diffraction 2.237 2.289 -- 160 2624 0.2129 0.2677 -- 87.0
X Ray Diffraction 2.289 2.3462 -- 135 2716 0.2186 0.2733 -- 91.0
X Ray Diffraction 2.3462 2.4096 -- 122 2775 0.2186 0.2938 -- 92.0
X Ray Diffraction 2.4096 2.4804 -- 146 2777 0.2136 0.2425 -- 92.0
X Ray Diffraction 2.4804 2.5604 -- 152 2772 0.2174 0.2763 -- 92.0
X Ray Diffraction 2.5604 2.6518 -- 152 2794 0.2125 0.2795 -- 93.0
X Ray Diffraction 2.6518 2.7578 -- 153 2802 0.2083 0.2776 -- 93.0
X Ray Diffraction 2.7578 2.8831 -- 135 2798 0.2064 0.2802 -- 93.0
X Ray Diffraction 2.8831 3.0349 -- 135 2850 0.1992 0.2611 -- 93.0
X Ray Diffraction 3.0349 3.2246 -- 174 2814 0.1927 0.2318 -- 94.0
X Ray Diffraction 3.2246 3.4728 -- 162 2965 0.1848 0.2171 -- 97.0
X Ray Diffraction 3.4728 3.821 -- 155 3046 0.1749 0.2059 -- 100.0
X Ray Diffraction 3.821 4.3709 -- 171 3092 0.148 0.1908 -- 100.0
X Ray Diffraction 4.3709 5.4956 -- 186 3106 0.1493 0.1856 -- 100.0
X Ray Diffraction 5.4956 23.7353 -- 182 3264 0.2043 0.2293 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 4.4438
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.1089
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -3.3349
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.057
f_dihedral_angle_d 13.563
f_angle_d 0.917
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6027
Nucleic Acid Atoms 0
Heterogen Atoms 221
Solvent Atoms 555

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
phaser Structure Solution
PHENIX (phenix.refine: dev_755) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_755) refinement
phaser model building
HKL-2000 data collection