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X-RAY DIFFRACTION
Materials and Methods page
3SE9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 9.9% PEG 4000, 9.0 % isopropanol, 100 mM Li2SO4, 100 mM HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.8 α = 90
    b = 66.48 β = 90
    c = 237.3 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-06-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 67230
    Number Reflections(Observed) 59364
    Percent Possible(Observed) 88.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 23.734
    Cut-off Sigma(F) 1.93
    Number of Reflections(all) 67229
    Number of Reflections(Observed) 59260
    Number of Reflections(R-Free) 3002
    Percent Reflections(Observed) 88.31
    R-Factor(Observed) 0.1922
    R-Work 0.19
    R-Free 0.2332
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.4438
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.1089
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.3349
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9999
    Shell Resolution(Low) 2.0326
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 1758
    R-Factor(R-Work) 0.2554
    R-Factor(R-Free) 0.3047
    Percent Reflections(Observed) 60.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0326
    Shell Resolution(Low) 2.0677
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 1986
    R-Factor(R-Work) 0.2399
    R-Factor(R-Free) 0.3122
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0677
    Shell Resolution(Low) 2.1052
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2119
    R-Factor(R-Work) 0.2297
    R-Factor(R-Free) 0.3262
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1052
    Shell Resolution(Low) 2.1457
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.2183
    R-Factor(R-Free) 0.2486
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1457
    Shell Resolution(Low) 2.1895
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2407
    R-Factor(R-Work) 0.2275
    R-Factor(R-Free) 0.2791
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1895
    Shell Resolution(Low) 2.237
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2505
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2843
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.237
    Shell Resolution(Low) 2.289
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.289
    Shell Resolution(Low) 2.3462
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2733
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3462
    Shell Resolution(Low) 2.4096
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2775
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4096
    Shell Resolution(Low) 2.4804
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2777
    R-Factor(R-Work) 0.2136
    R-Factor(R-Free) 0.2425
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4804
    Shell Resolution(Low) 2.5604
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2772
    R-Factor(R-Work) 0.2174
    R-Factor(R-Free) 0.2763
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5604
    Shell Resolution(Low) 2.6518
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.2125
    R-Factor(R-Free) 0.2795
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6518
    Shell Resolution(Low) 2.7578
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2776
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7578
    Shell Resolution(Low) 2.8831
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2798
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.2802
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8831
    Shell Resolution(Low) 3.0349
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2850
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0349
    Shell Resolution(Low) 3.2246
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2814
    R-Factor(R-Work) 0.1927
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2246
    Shell Resolution(Low) 3.4728
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2171
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4728
    Shell Resolution(Low) 3.821
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3046
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2059
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.821
    Shell Resolution(Low) 4.3709
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3092
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.1908
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3709
    Shell Resolution(Low) 5.4956
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3106
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1856
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4956
    Shell Resolution(Low) 23.7353
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3264
    R-Factor(R-Work) 0.2043
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.057
    f_dihedral_angle_d 13.563
    f_angle_d 0.917
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6027
    Nucleic Acid Atoms 0
    Heterogen Atoms 221
    Solvent Atoms 555
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phaser
    Structure Refinement PHENIX (phenix.refine: dev_755)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_755)
    model building phaser
    data collection HKL-2000