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X-RAY DIFFRACTION
Materials and Methods page
3SE8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 9 % PEG 4000, 200 mM Li2SO4, 100 mM Tris/Cl-, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.01 α = 90
    b = 70.26 β = 90
    c = 217.88 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-01-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.89
    Resolution(Low) 50
    Number Reflections(All) 76674
    Number Reflections(Observed) 69237
    Percent Possible(Observed) 90.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.895
    Resolution(Low) 37.032
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 76632
    Number of Reflections(Observed) 69130
    Number of Reflections(R-Free) 3470
    Percent Reflections(Observed) 90.21
    R-Factor(Observed) 0.1893
    R-Work 0.1869
    R-Free 0.2328
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.7272
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.6955
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.4227
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8946
    Shell Resolution(Low) 1.9206
    Number of Reflections(R-Free) 63
    Number of Reflections(R-Work) 1452
    R-Factor(R-Work) 0.3099
    R-Factor(R-Free) 0.3744
    Percent Reflections(Observed) 51.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9206
    Shell Resolution(Low) 1.948
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1706
    R-Factor(R-Work) 0.2879
    R-Factor(R-Free) 0.3626
    Percent Reflections(Observed) 59.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.948
    Shell Resolution(Low) 1.9771
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 2032
    R-Factor(R-Work) 0.2699
    R-Factor(R-Free) 0.3507
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9771
    Shell Resolution(Low) 2.008
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2228
    R-Factor(R-Work) 0.2484
    R-Factor(R-Free) 0.3403
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.008
    Shell Resolution(Low) 2.0409
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2396
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.3023
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0409
    Shell Resolution(Low) 2.0761
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.3013
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0761
    Shell Resolution(Low) 2.1139
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2334
    R-Factor(R-Free) 0.2833
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1139
    Shell Resolution(Low) 2.1545
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.2229
    R-Factor(R-Free) 0.2735
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1545
    Shell Resolution(Low) 2.1985
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.3032
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1985
    Shell Resolution(Low) 2.2463
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.3012
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2463
    Shell Resolution(Low) 2.2985
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.198
    R-Factor(R-Free) 0.2384
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2985
    Shell Resolution(Low) 2.356
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2839
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.356
    Shell Resolution(Low) 2.4197
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4197
    Shell Resolution(Low) 2.4909
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.2169
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4909
    Shell Resolution(Low) 2.5712
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2754
    R-Factor(R-Work) 0.212
    R-Factor(R-Free) 0.3029
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5712
    Shell Resolution(Low) 2.6631
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2606
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6631
    Shell Resolution(Low) 2.7697
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7697
    Shell Resolution(Low) 2.8957
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2812
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8957
    Shell Resolution(Low) 3.0483
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1835
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0483
    Shell Resolution(Low) 3.2392
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2853
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2523
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2392
    Shell Resolution(Low) 3.4891
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2828
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4891
    Shell Resolution(Low) 3.8399
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8399
    Shell Resolution(Low) 4.3948
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.19
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3948
    Shell Resolution(Low) 5.534
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2939
    R-Factor(R-Work) 0.1415
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.534
    Shell Resolution(Low) 37.0387
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.1999
    R-Factor(R-Free) 0.2257
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.058
    f_dihedral_angle_d 13.56
    f_angle_d 0.971
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6052
    Nucleic Acid Atoms 0
    Heterogen Atoms 210
    Solvent Atoms 643
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: dev_755)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_755)
    model building Phaser
    data collection HKL-2000