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X-RAY DIFFRACTION
Materials and Methods page
3S6Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 298.0
    Details 15% PEG200, 0.1M MES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.15 α = 90
    b = 333.18 β = 90
    c = 58.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-02-27
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength List 0.975500
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.28
    Resolution(Low) 48.06
    Number Reflections(All) 78294
    Number Reflections(Observed) 75918
    Percent Possible(Observed) 97.0
    R Merge I(Observed) 0.053
     
    High Resolution Shell Details
    Resolution(High) 2.28
    Resolution(Low) 2.34
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.435
    Mean I Over Sigma(Observed) 3.17
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.28
    Resolution(Low) 48.058
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 78294
    Number of Reflections(Observed) 75914
    Number of Reflections(R-Free) 3828
    Percent Reflections(Observed) 96.03
    R-Factor(Observed) 0.1753
    R-Work 0.173
    R-Free 0.2194
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.2371
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.8497
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.0868
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.28
    Shell Resolution(Low) 2.361
    Number of Reflections(R-Free) 348
    Number of Reflections(R-Work) 6568
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.2972
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.361
    Shell Resolution(Low) 2.4556
    Number of Reflections(R-Free) 389
    Number of Reflections(R-Work) 7282
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.3131
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4556
    Shell Resolution(Low) 2.5673
    Number of Reflections(R-Free) 389
    Number of Reflections(R-Work) 7293
    R-Factor(R-Work) 0.2343
    R-Factor(R-Free) 0.311
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5673
    Shell Resolution(Low) 2.7027
    Number of Reflections(R-Free) 392
    Number of Reflections(R-Work) 7279
    R-Factor(R-Work) 0.1886
    R-Factor(R-Free) 0.2585
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7027
    Shell Resolution(Low) 2.872
    Number of Reflections(R-Free) 375
    Number of Reflections(R-Work) 7281
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.2103
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.872
    Shell Resolution(Low) 3.0937
    Number of Reflections(R-Free) 382
    Number of Reflections(R-Work) 7326
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.2065
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0937
    Shell Resolution(Low) 3.4049
    Number of Reflections(R-Free) 374
    Number of Reflections(R-Work) 7248
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4049
    Shell Resolution(Low) 3.8974
    Number of Reflections(R-Free) 395
    Number of Reflections(R-Work) 7217
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8974
    Shell Resolution(Low) 4.9096
    Number of Reflections(R-Free) 397
    Number of Reflections(R-Work) 7166
    R-Factor(R-Work) 0.1299
    R-Factor(R-Free) 0.1765
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9096
    Shell Resolution(Low) 48.0689
    Number of Reflections(R-Free) 387
    Number of Reflections(R-Work) 7426
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2117
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.066
    f_dihedral_angle_d 14.909
    f_angle_d 1.018
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6663
    Nucleic Acid Atoms 0
    Heterogen Atoms 104
    Solvent Atoms 715
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    molecular replacement AMORE
    data reduction Xscale