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X-RAY DIFFRACTION
Materials and Methods page
3S6Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 298.0
    Details 15% PEG200, 0.1M MES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.15 α = 90
    b = 333.18 β = 90
    c = 58.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2009-12-04
     
    Diffraction Radiation
    Monochromator Si 111 Double Crystal Monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 1.0000
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.79
    Resolution(Low) 48.06
    Number Reflections(All) 43217
    Number Reflections(Observed) 43203
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.105
     
    High Resolution Shell Details
    Resolution(High) 2.79
    Resolution(Low) 2.87
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.549
    Mean I Over Sigma(Observed) 5.01
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.79
    Resolution(Low) 48.058
    Cut-off Sigma(F) 2.02
    Number of Reflections(all) 43217
    Number of Reflections(Observed) 43194
    Number of Reflections(R-Free) 2188
    Percent Reflections(Observed) 98.65
    R-Factor(Observed) 0.161
    R-Work 0.1584
    R-Free 0.2082
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 4.8358
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.6892
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 16.6881
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.79
    Shell Resolution(Low) 2.8854
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3506
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2927
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8854
    Shell Resolution(Low) 3.0009
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 4092
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.2214
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0009
    Shell Resolution(Low) 3.1375
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 4075
    R-Factor(R-Work) 0.1641
    R-Factor(R-Free) 0.241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1375
    Shell Resolution(Low) 3.3029
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4118
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3029
    Shell Resolution(Low) 3.5098
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 4115
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.2409
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5098
    Shell Resolution(Low) 3.7806
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4116
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7806
    Shell Resolution(Low) 4.1609
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 4166
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.1915
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1609
    Shell Resolution(Low) 4.7625
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4152
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7625
    Shell Resolution(Low) 5.9985
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4209
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9985
    Shell Resolution(Low) 48.0653
    Number of Reflections(R-Free) 233
    Number of Reflections(R-Work) 4457
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 17.097
    f_angle_d 1.149
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6648
    Nucleic Acid Atoms 0
    Heterogen Atoms 107
    Solvent Atoms 429
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.10
    refinement phenix
    data reduction Xscale