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X-RAY DIFFRACTION
Materials and Methods page
3S6X
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 298.0
    Details 15% PEG200, 0.1M MES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 87.15 α = 90
    b = 333.18 β = 90
    c = 58.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2008-11-16
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength List 0.9185
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.25
    Resolution(Low) 38.61
    Number Reflections(All) 82127
    Number Reflections(Observed) 78323
    Percent Possible(Observed) 95.3
     
    High Resolution Shell Details
    Resolution(High) 2.25
    Resolution(Low) 2.31
    Percent Possible(All) 89.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.25
    Resolution(Low) 38.611
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 82127
    Number of Reflections(Observed) 78322
    Number of Reflections(R-Free) 3956
    Percent Reflections(Observed) 95.37
    R-Factor(Observed) 0.1597
    R-Work 0.1576
    R-Free 0.1989
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.7915
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.6597
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.4511
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.25
    Shell Resolution(Low) 2.3304
    Number of Reflections(R-Free) 382
    Number of Reflections(R-Work) 6818
    R-Factor(R-Work) 0.2466
    R-Factor(R-Free) 0.292
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3304
    Shell Resolution(Low) 2.4237
    Number of Reflections(R-Free) 356
    Number of Reflections(R-Work) 6825
    R-Factor(R-Work) 0.2131
    R-Factor(R-Free) 0.256
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4237
    Shell Resolution(Low) 2.534
    Number of Reflections(R-Free) 353
    Number of Reflections(R-Work) 6763
    R-Factor(R-Work) 0.2037
    R-Factor(R-Free) 0.2895
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.534
    Shell Resolution(Low) 2.6676
    Number of Reflections(R-Free) 379
    Number of Reflections(R-Work) 7220
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6676
    Shell Resolution(Low) 2.8346
    Number of Reflections(R-Free) 386
    Number of Reflections(R-Work) 7456
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8346
    Shell Resolution(Low) 3.0534
    Number of Reflections(R-Free) 401
    Number of Reflections(R-Work) 7610
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0534
    Shell Resolution(Low) 3.3605
    Number of Reflections(R-Free) 411
    Number of Reflections(R-Work) 7776
    R-Factor(R-Work) 0.162
    R-Factor(R-Free) 0.2018
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3605
    Shell Resolution(Low) 3.8464
    Number of Reflections(R-Free) 424
    Number of Reflections(R-Work) 7827
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8464
    Shell Resolution(Low) 4.8446
    Number of Reflections(R-Free) 438
    Number of Reflections(R-Work) 7876
    R-Factor(R-Work) 0.115
    R-Factor(R-Free) 0.1532
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8446
    Shell Resolution(Low) 38.6164
    Number of Reflections(R-Free) 426
    Number of Reflections(R-Work) 8195
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.063
    f_dihedral_angle_d 17.845
    f_angle_d 0.985
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6655
    Nucleic Acid Atoms 0
    Heterogen Atoms 129
    Solvent Atoms 812
     
     
  •   Software and Computing Hide
    Computing
    Data Collection XDS
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building AMoRE
    data collection XDS