X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 298.0
Details 15% PEG200, 0.1M MES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 87.15 α = 90
b = 333.18 β = 90
c = 58.49 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2008-11-16
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9185 ESRF ID14-4

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 38.61 95.3 -- -- -- -- 82127 78323 -3.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.31 89.7 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.25 38.611 -- 2.0 82127 78322 3956 95.37 -- 0.1597 0.1576 0.1989 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.25 2.3304 -- 382 6818 0.2466 0.292 -- 89.0
X Ray Diffraction 2.3304 2.4237 -- 356 6825 0.2131 0.256 -- 89.0
X Ray Diffraction 2.4237 2.534 -- 353 6763 0.2037 0.2895 -- 88.0
X Ray Diffraction 2.534 2.6676 -- 379 7220 0.1657 0.2153 -- 93.0
X Ray Diffraction 2.6676 2.8346 -- 386 7456 0.1597 0.2157 -- 96.0
X Ray Diffraction 2.8346 3.0534 -- 401 7610 0.15 0.1936 -- 98.0
X Ray Diffraction 3.0534 3.3605 -- 411 7776 0.162 0.2018 -- 100.0
X Ray Diffraction 3.3605 3.8464 -- 424 7827 0.15 0.1938 -- 100.0
X Ray Diffraction 3.8464 4.8446 -- 438 7876 0.115 0.1532 -- 100.0
X Ray Diffraction 4.8446 38.6164 -- 426 8195 0.1677 0.1936 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -4.7915
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -4.6597
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 9.4511
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.063
f_dihedral_angle_d 17.845
f_angle_d 0.985
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6655
Nucleic Acid Atoms 0
Heterogen Atoms 129
Solvent Atoms 812

Software

Computing
Computing Package Purpose
XDS Data Collection
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
AMoRE Structure Solution
PHENIX (phenix.refine: 1.7.1_743) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.1_743) refinement
AMoRE model building
XDS data collection