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X-RAY DIFFRACTION
Materials and Methods page
3S6I
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 294.0
    Details 0.1 M MES (pH 6.5), 20% (w/v) PEG 8K and 2.4% (v/v) glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.32 α = 90
    b = 112.3 β = 99.55
    c = 61.11 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
    Diffrn ID 2
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2009-02-17
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2009-02-16
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-D
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 0.9792
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.28
    Resolution(Low) 29.1
    Number Reflections(All) 32231
    Number Reflections(Observed) 32231
    Percent Possible(Observed) 99.6
    B(Isotropic) From Wilson Plot 40.8
    Redundancy 4.8
     
    High Resolution Shell Details
    Resolution(High) 2.28
    Resolution(Low) 2.38
    Percent Possible(All) 98.1
    Mean I Over Sigma(Observed) 2.5
    R-Sym I(Observed) 0.404
    Redundancy 3.4
    Number Unique Reflections(All) 3176
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.28
    Resolution(Low) 29.1
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 32199
    Number of Reflections(Observed) 32188
    Number of Reflections(R-Free) 1631
    Percent Reflections(Observed) 97.29
    R-Factor(All) 0.2362
    R-Factor(Observed) 0.1869
    R-Work 0.1849
    R-Free 0.2254
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.1752
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.0957
    Anisotropic B[2][2] -2.3552
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.5304
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.277
    Shell Resolution(Low) 2.3439
    Number of Reflections(R-Free) 86
    Number of Reflections(R-Work) 1871
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3439
    Shell Resolution(Low) 2.4196
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2625
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4196
    Shell Resolution(Low) 2.506
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2754
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.506
    Shell Resolution(Low) 2.6063
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2346
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6063
    Shell Resolution(Low) 2.7248
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2084
    R-Factor(R-Free) 0.2623
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7248
    Shell Resolution(Low) 2.8683
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.2102
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8683
    Shell Resolution(Low) 3.0479
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2699
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0479
    Shell Resolution(Low) 3.2829
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1911
    R-Factor(R-Free) 0.2085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2829
    Shell Resolution(Low) 3.6127
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6127
    Shell Resolution(Low) 4.1342
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1342
    Shell Resolution(Low) 5.2038
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2038
    Shell Resolution(Low) 29.1056
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.068
    f_dihedral_angle_d 21.87
    f_angle_d 1.185
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3184
    Nucleic Acid Atoms 845
    Heterogen Atoms 2
    Solvent Atoms 112
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine)
     
    Software
    refinement PHENIX version: (phenix.refine)
    model building SHARP
    data collection HKL-2000