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X-RAY DIFFRACTION
Materials and Methods page
3S2Y
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.5
    Temperature 293.0
    Details 20% PEG4000, 10% isopropanol, hepes 7.5, VAPOR DIFFUSION, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 119.68 α = 90
    b = 90.05 β = 119.61
    c = 95.23 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-03-02
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.98
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(Low) 50
    Number Reflections(All) 43812
    Number Reflections(Observed) 41698
    Percent Possible(Observed) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.244
    Resolution(Low) 45.822
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 43812
    Number of Reflections(Observed) 41698
    Number of Reflections(R-Free) 2114
    Percent Reflections(Observed) 99.03
    R-Factor(Observed) 0.1958
    R-Work 0.1934
    R-Free 0.2383
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0714
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.0661
    Anisotropic B[2][2] 0.0348
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.1061
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2445
    Shell Resolution(Low) 2.2967
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2353
    R-Factor(R-Work) 0.266
    R-Factor(R-Free) 0.3379
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2967
    Shell Resolution(Low) 2.3541
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2547
    R-Factor(R-Free) 0.3315
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3541
    Shell Resolution(Low) 2.4178
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2472
    R-Factor(R-Free) 0.3192
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4178
    Shell Resolution(Low) 2.4889
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2465
    R-Factor(R-Free) 0.3388
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4889
    Shell Resolution(Low) 2.5692
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.2231
    R-Factor(R-Free) 0.2961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5692
    Shell Resolution(Low) 2.661
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.2726
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.661
    Shell Resolution(Low) 2.7676
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7676
    Shell Resolution(Low) 2.8935
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.3012
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8935
    Shell Resolution(Low) 3.046
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2599
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.046
    Shell Resolution(Low) 3.2368
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.2319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2368
    Shell Resolution(Low) 3.4867
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4867
    Shell Resolution(Low) 3.8374
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.1837
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8374
    Shell Resolution(Low) 4.3923
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3923
    Shell Resolution(Low) 5.5323
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5323
    Shell Resolution(Low) 45.8312
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.687
    f_angle_d 1.131
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5460
    Nucleic Acid Atoms 0
    Heterogen Atoms 140
    Solvent Atoms 328
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building AMoRE
    data collection HKL-2000