X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 293.0
Details 100 mM Tris-HCl (pH 8), 50 mM cadmium sulfate, 900 mM sodium acetate (reservoir) and 50 mM deoxycholic acid (additive), VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.84 α = 90
b = 81.78 β = 90
c = 100.47 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 vertical collimating mirror 2008-07-30
Diffraction Radiation
Monochromator Protocol
double crystal monochromator (DCM) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.98066 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 98.4 0.067 -- -- 3.9 22061 21706 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 99.1 0.176 -- 5.7 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.2 33.01 -- -- -- 20909 1128 98.47 -- 0.22826 0.22541 0.28148 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.257 -- 84 1541 0.236 0.265 -- 98.84
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 41.299
Anisotropic B[1][1] -0.69
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.52
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.84
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 4.325
r_scbond_it 4.03
r_mcangle_it 1.509
r_mcbond_it 1.338
r_gen_planes_refined 0.007
r_chiral_restr 0.123
r_dihedral_angle_4_deg 8.612
r_dihedral_angle_3_deg 18.301
r_dihedral_angle_2_deg 40.992
r_dihedral_angle_1_deg 5.976
r_angle_refined_deg 1.887
r_bond_refined_d 0.032
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2518
Nucleic Acid Atoms 0
Heterogen Atoms 164
Solvent Atoms 133

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHELXS Structure Solution
REFMAC 5.5.0109 Structure Refinement
Software
Software Name Purpose
REFMAC version: 5.5.0109 refinement
SHELXS model building
HKL-2000 data collection