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X-RAY DIFFRACTION
Materials and Methods page
3RV5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 293.0
    Details 100 mM Tris-HCl (pH 8), 50 mM cadmium sulfate, 900 mM sodium acetate (reservoir) and 50 mM deoxycholic acid (additive), VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.84 α = 90
    b = 81.78 β = 90
    c = 100.47 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-300
    Details vertical collimating mirror
    Collection Date 2008-07-30
     
    Diffraction Radiation
    Monochromator double crystal monochromator (DCM)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 0.98066
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 22061
    Number Reflections(Observed) 21706
    Percent Possible(Observed) 98.4
    R Merge I(Observed) 0.067
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.28
    Percent Possible(All) 99.1
    R Merge I(Observed) 0.176
    Mean I Over Sigma(Observed) 5.7
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.2
    Resolution(Low) 33.01
    Number of Reflections(Observed) 20909
    Number of Reflections(R-Free) 1128
    Percent Reflections(Observed) 98.47
    R-Factor(Observed) 0.22826
    R-Work 0.22541
    R-Free 0.28148
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 41.299
    Anisotropic B[1][1] -0.69
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 1.52
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.84
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.257
    Number of Reflections(R-Free) 84
    Number of Reflections(R-Work) 1541
    R-Factor(R-Work) 0.236
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 98.84
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 4.325
    r_scbond_it 4.03
    r_mcangle_it 1.509
    r_mcbond_it 1.338
    r_gen_planes_refined 0.007
    r_chiral_restr 0.123
    r_dihedral_angle_4_deg 8.612
    r_dihedral_angle_3_deg 18.301
    r_dihedral_angle_2_deg 40.992
    r_dihedral_angle_1_deg 5.976
    r_angle_refined_deg 1.887
    r_bond_refined_d 0.032
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2518
    Nucleic Acid Atoms 0
    Heterogen Atoms 164
    Solvent Atoms 133
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.5.0109
     
    Software
    refinement REFMAC version: 5.5.0109
    model building SHELXS
    data collection HKL-2000